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| International Standard Category: Testing of metals in general |
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
硅和锗体内少数载流子寿命测定光电导衰减法 ;
| Category No.: | 77.040.01 | Valid Status: | superseded |
| Issued Organization: | SBTS | Issued Date: | 1997-06-03 |
| Implemented Date: | 1997-1-2 | Abolished Date: | 2010-06-01 |
| Superseded Standard.: | GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay |
Superseded Date: | 2010-6-1 |
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