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International Standard Category: Other standards related to analytical chemistry

GB/T 20724-2006    Method of thickness measurement for thin crystal by convergent beam electron diffraction
薄晶体厚度的会聚束电子衍射测定方法 ;
Category No.:71.040.99 Valid Status:superseded
Issued Organization:AQSIQ; SAC Issued Date:2007-03-26
Implemented Date:2007-8-1 Abolished Date:
Superseded Standard.:GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
Superseded Date:2022-7-1
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