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International Standard Category: Semiconducting materials

GB/T 24582-2009    Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质;
Category No.:29.045 Valid Status:superseded
Issued Organization:AQSIQ,SAC Issued Date:2009-10-30
Implemented Date:2010-6-1 Abolished Date:
Superseded Standard.:GB/T 24582-2023
Superseded Date:2024-3-1
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