 |
Chinese Classification
Professional Classification
ICS Classification
Latest
Value-added Services
|
| International Standard Category: Semiconducting materials |
GB/T 6616-2009 Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge
半导体硅片电阻率及硅薄膜薄层电阻测试方法 非接触涡流法;
| Category No.: | 29.045 | Valid Status: | superseded |
| Issued Organization: | AQSIQ; SAC | Issued Date: | 2009-10-30 |
| Implemented Date: | 2010-6-1 | Abolished Date: | |
| Superseded Standard.: | GB/T 6616-2023 Test method for resistivity of semiconductor wafers and sheet resistance of semiconductor films—Noncontact eddy-current gauge |
Superseded Date: | 2024-3-1 |
| Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 |
| Copyright: Foryou Tech Co., Ltd. 2008-2020 |