| Title |
Standard No. |
Implemented On |
| Test method for the content of surface metal elements on silicon wafers—Inductively coupled plasma mass spectrometry | GB/T 39145-2020 | 2021-9-1 |
| Test method for magnesium content in gallium nitride materials—Secondary ion mass spectrometry | GB/T 39144-2020 | 2021-9-1 |
| Test method for chloride content of silicon—Ion chromatography method | GB/T 37385-2019 | 2020-2-1 |
| Methods for chemical analysis of germanium metal—Part 2:Determination of aluminium,iron,copper,nickle,lead,cadmium,magnesium,cobalt,indium,zinc content—Inductively coupled plasma mass spectrometry method | GB/T 37211.2-2018 | 2019-11-1 |
| Methods for chemical analysis of germanium metal—Part 1:Determination of arsenic content—Arsenic stain method | GB/T 37211.1-2018 | 2019-11-1 |
| Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere | GB/T 4059-2018 | 2019-11-1 |
| Test method for determining interstitial oxygen content in silicon by infrared absorption | GB/T 1557-2018 | 2019-6-1 |
| Test method for boron content in polycrystalline silicon by vacuum zone-melting method | GB/T 4060-2018 | 2019-6-1 |
| Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method | GB/T 37049-2018 | 2019-4-1 |
| Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies | GB/T 35309-2017 | 2018-7-1 |
| Test method for carbon and oxygen content of single crystal silicon―Low temperature fourier transform infrared spectrometry | GB/T 35306-2017 | 2018-7-1 |
| Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry | GB/T 32281-2015 | 2017-1-1 |
| Test method for instrumental neutron activation analysis (INAA) of silicon | GB/T 32277-2015 | 2017-1-1 |
| Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy | GB/T 24578-2015 | 2017-1-1 |
| Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy | GB/T 17170-2015 | 2016-7-1 |
| Test methods for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy | GB/T 19199-2015 | 2016-7-1 |
| Determination of total carbon content in trichlorosilane for silicon eqitaxy―Gas chromatographic method | YS/T 1059-2015 | 2015-10-1 |
| Determination of other chlorosilane in trichlorosilane for silicon eqitaxy―Gas chromatographic method | YS/T 1060-2015 | 2015-10-1 |
| Determination of impurities of high purity gallium oxide—Inductively coupled plasma-mass spectrmetry | YS/T 980-2014 | 2015-4-1 |
| Methods for chemical analysis of high purity indium―Determination of magnesiumaluminumsiliconsulphurironnickelcopperzinc,arsenic,silver,cadmium,tin,thallium,lead content―High mass resolution glow discharge mass specrometry | YS/T 981.1-2014 | 2015-4-1 |
| Method for chemical analysis of the high-purity arsenic—Predicating method for determinating the concentration of sulfur | YS/T 34.3-2011 | 2012-7-1 |
| Method for chemical analysis of the high-purity arsenic—Predicating method for determinating the concentration of selenium | YS/T 34.2-2011 | 2012-7-1 |
| Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic | YS/T 34.1-2011 | 2012-7-1 |
| Standard test method for dimensions of notches on silicon wafers | GB/T 26067-2010 | 2011-10-1 |
| Germanium monocrystal—Measurement of resistivity-DC linear four-point probe | GB/T 26074-2010 | 2011-10-1 |
| Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method | GB/T 26070-2010 | 2011-10-1 |
| Methods for chemical analysis of arsenic Part 2: Determination of antimony content-Malachite green spectrophotometric method | YS/T 519.2-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 6: Determination of sulfur content - Diphenylcarbazide spectrophotometry | YS/T 226.6-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium - Part 12: Determination of selenium content - Sodium thiosulphate titrimetric method | YS/T 226.12-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium - Part 2: Determination of antimony content - Hydride generation-atomic fluorescence spectrometry | YS/T 226.2-2009 | 2010-6-1 |
| Methods for chemical analysis of arsenic Part 3:Determination of sulfur content-Barium sulphate gravimetric method | YS/T 519.3-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 9:Determination of iron content-Flame atomic absorption spectrometry | YS/T 226.9-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 11: Determination of lead content-Flame atomic absorption spectrometry | YS/T 226.11-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium—Part 4:Determination of mercury content—Dithizone-carbon tetrachloride titrated colorimetric-method | YS/T 226.4-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 8:Determination of copper content-Flame atomic absorption spectrometry | YS/T 226.8-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 3:Determination of aluminum content-Chrome azurol S-Cetyl trimethyl ammonium bromide absorption photometric method | YS/T 226.3-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium—Part 5:Determination of silicon content—Molybdenum blue spectrophotometric method | YS/T 226.5-2009 | 2010-6-1 |
| Methods for chemical analysis of arsenic - Part 1: Determination of arsenic content - Potassium bromate titrimetric method | YS/T 519.1-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 7: Determination of magnesium content-Flame atomic absorption spectrometry | YS/T 226.7-2009 | 2010-6-1 |
| Methods for chemical analysis of selenium Part 10:Determination of nickel content-Flame atomic absorption spectrometry | YS/T 226.10-2009 | 2010-6-1 |
| Methods for chemical analysis of arsenic Part 4: Determination of bismuth antimony and sulfur content-Inductively coupled plasma atomic emission spectrometry | YS/T 519.4-2009 | 2010-6-1 |
| for chemical analysis of silicon metal - Part 4: Determination of elements content Inductively coupled plasma atomic emission spectrometric method | GB/T 14849.4-2008 | 2008-12-1 |
| Polycrystalline silicon—Examination method—Zone-melting on phosphorus under controlled atmosphere | GB/T 4059-2007 | 2008-2-1 |
| Standard method for measuring radial resistivity variation on silicon slices | GB/T 11073-2007 | 2008-2-1 |
| Polycrystalline silicon—Examination method—Vacuum zone-melting on boron | GB/T 4060-2007 | 2008-2-1 |
| Methods for chemical analysis of calcium-silicon - The EDTA titrimetric method for the determination of aluminum content | YB/T 5314-2006 | 2006-10-11 |
| Methods for chemical analysis of calcium-silicon The infrared absorption method and the combustion - Potassiumiodate titration method for the determination of sulfur content | YB/T 5317-2006 | 2006-10-11 |
| Methods for chemical analysis of arsenic The malachite green photometric method for the determination of antimony content | YS/T 519.2-2006 | 2006-10-11 |
| Methods for chemical analysis of calcium-silicon | YB/T 5312-2006 | 2006-10-11 |
| Methods for chemical analysis of arsenic The dithiodiantipyryl methane photometric method for the determination of kismuth content | YS/T 519.4-2006 | 2006-10-11 |
| Methods for chemical analysis of arsenic The barium sulphate gravimetric method for the determination of sulphur content | YS/T 519.3-2006 | 2006-10-11 |
| Methods for chemical analysis of calcium-silicon The infrared absorption method the determination of carbon content | YB/T 5316-2006 | 2006-10-11 |
| Methods for chemical analysis of calcium-silicon -- The phosphomolybdenum blue photometric method for the determination of phosphorus content | YB/T 5315-2006 | 2006-10-11 |
| Methods for chemical analysis of arsenic The potassium bromate volumetric method for the determination of arsenic content | YS/T 519.1-2006 | 2006-10-11 |
| Determination of iron aluminium calcium magnesium manganese zinc copper titanium chromium nickel vanadium in metal silicon - Inductively coupled plasma atomic emission spectrometry | SN/T 1650-2005 | 2006-5-1 |
| Standard test methods for measuring site flatness on silicon wafers by noncontact scanning | GB/T 19922-2005 | 2006-4-1 |
| Test method of particles on silicon wafer surfaces | GB/T 19921-2005 | 2006-4-1 |
| Method for the sampling and sample preparation of silicon carbide packed in metricton bags for import and export | SN/T 1039-2002 | 2002-6-1 |
| Methods for chemical analysis of calcium-silicon- The phosphomolybdenum blue photometric method for the determination of phosphorus content | GB/T 4700.4-1998 | 1999-7-1 |
| Methods for chemical analysis of calcium-silicon -The infrared absorption method and the combustion-potassium iodate titration method for the determination of sulfur content | GB/T 4700.7-1998 | 1999-7-1 |
| Methods for chemical analysis of calcium-silicon-The infrared absorption method for the determination of carbon content | GB/T 4700.5-1998 | 1999-7-1 |
| Determination of sulphur content in tellurium--Barium sulfate turbidimetry | YS/T 227.7-1994 | 1996-3-12 |
| Determination of magnesium and sodium contents in tellurium--Atomic absorption spectrophotometric method | YS/T 227.8-1994 | 1996-3-12 |
| Determination of mercury content in selenium | YS/T 226.5-1994 | 1996-3-12 |
| Determination of arsenic content in tellurium--n-butyl alcohol extraction arsenic-molybdenum blue photometric method | YS/T 227.10-1994 | 1996-3-12 |
| Determination of bismuth content in tellurium--Potassium iodide brucine photometric method | YS/T 227.1-1994 | 1996-3-12 |
| Determination of silicon content in selenium--Silicon-molybdenum blue photometric method | YS/T 226.7-1994 | 1996-3-12 |
| Determination of copper content in tellurium--Neocuproine Chloroform extraction photometric method | YS/T 227.6-1994 | 1996-3-12 |
| Determination of aluminum content in tellurium--Chromazurol S-tetradecyl pyridine bromide photometric method | YS/T 227.2-1994 | 1996-3-12 |
| Determination of selenium content in tellurium--2 3-diaminonaphthalene absorption photometric method | YS/T 227.5-1994 | 1996-3-12 |
| Determination of iron content in tellurium--1 10-phenanthroline photometric method | YS/T 227.4-1994 | 1996-3-12 |
| Determination of tellurium content in tellurium--Potassium dichromate-ammonium ferrous sulfate volumetric method | YS/T 227.9-1994 | 1996-3-12 |
| Determination of lead content in tellurium--Dithizone-carbon tetrachloride extraction photometric method | YS/T 227.3-1994 | 1996-3-12 |
| Determination of silicon content in tellurium--n-butyl alcohol extraction silicon-molybdenum blue photometric method | YS/T 227.11-1994 | 1996-3-12 |
| Silicon metal--Determination of calciumcontent | GB/T 14849.3-1993 | 1994-9-1 |
| Silicon metal－Determination of iron content－1,10-Phenanthroline spectrophotometric method | GB/T 14849.1-1993 | 1994-9-1 |
| Silicon metal--Determination of aluminium content--Chrome azurol S spectrophotometric method | GB/T 14849.2-1993 | 1994-9-1 |
| Determination of selenium content in selenium--Thiosulfate volumetric method | YS/T 226.15-1994 | 1993-3-1 |
| Determination of sulphur content in selenium--Distillation-reduction photometric method | YS/T 226.10-1994 | 1993-3-1 |
| Determination of magnesium copper iron and nickel content in selenium--Atomic absorption spectrophotometric method | YS/T 226.11-1994 | 1993-3-1 |
| Determination of carbon content in selenium - Combustion conductometric titration method | YS/T 226.14-1994 | 1993-3-1 |
| Determination of aluminum content in selenium--Chrome azurol S--Cetyl trimethyl ammonium bromide absorption photometric method | YS/T 226.4-1994 | 1993-3-1 |
| Determination of lead content in selenium--Oscillopolarographic method | YS/T 226.12-1994 | 1993-3-1 |
| Determination of antimony content in selenium--Malachite green photometric method | YS/T 226.2-1994 | 1993-3-1 |
| Methods for chemical analysis of calcium-silicon;The EDTA titrimetric method for the determination of aluminum content | GB/T 4700.3-1984 | 1985-9-1 |
| Methods for chemical analysis of calcium-silicon;The perchloric acid dehydration-gravimetric method for the determination of silicon content | GB/T 4700.1-1984 | 1985-9-1 |
| Methods for chemical analysis of arsenic;The malachite green photometric method for the determination of antimony content | GB/T 4373.2-1984 | 1985-4-1 |
| Methods for chemical analysis of arsenic;The barium sulphate gravimetric method for the determination of sulphur content | GB/T 4373.3-1984 | 1985-4-1 |
| Methods for chemical analysis of arsenic;The dithio-diantipyrylmethane photometric method for the determination of bismuth content | GB/T 4373.4-1984 | 1985-4-1 |
| The activation analysis method for the determination of elemental impurities in semiconductor silicon materials | GB 4298-1984 | 1985-3-1 |
| Determination of silicon content in tellurium--n-butyl alcohol extraction silicon-molybdenum blue photometric method | GB 2147-1980 | 1981-10-1 |
| Determination of sulphur content in tellurium--Barium sulfate turbidimetry | GB 2143-1980 | 1981-10-1 |
| Determination of lead content in tellurium--Dithizone-carbon tetrachloride extraction photometric method | GB 2139-1980 | 1981-10-1 |
| Determination of sulphur content in selenium--Distillation-reduction photometric method | GB 2119-1980 | 1981-10-1 |
| Determination of aluminum content in tellurium--Chromazurol S-tetradecyl pyridine bromide photometric method | GB 2138-1980 | 1981-10-1 |
| Determination of copper content in tellurium--Neocuproine Chloroform extraction photometric method | GB 2142-1980 | 1981-10-1 |
| Determination of selenium content in tellurium--2, 3-diaminonaphthalene absorption photometric method | GB 2141-1980 | 1981-10-1 |
| Determination of tellurium content in tellurium--Potassium dichromate-ammonium ferrous sulfate volumetric method | GB 2145-1980 | 1981-10-1 |
| Determination of bismuth content in tellurium--Potassium iodide, brucine photometric method | GB 2137-1980 | 1981-10-1 |
| Determination of iron content in tellurium--1, 10-phenanthroline photometric method | GB 2140-1980 | 1981-10-1 |
| Determination of selenium content in selenium--Thiosulfate volumetric method | GB 2124-1980 | 1981-10-1 |
| Determination of aluminum content in selenium--Chrome azurol S--Cetyl trimethyl ammonium bromide absorption photometric method | GB 2113-1980 | 1981-10-1 |
| Determination of magnesium, copper, iron and nickel content in selenium--Atomic absorption spectrophotometric method | GB 2120-1980 | 1981-10-1 |
| Determination of lead content in selenium--Oscillopolarographic method | GB 2121-1980 | 1981-10-1 |
| Determination of silicon content in selenium--Silicon-molybdenum blue photometric method | GB 2116-1980 | 1981-10-1 |
| Determination of mercury content in selenium | GB 2114-1980 | 1981-10-1 |
| Determination of carbon content in selenium--Combustion conductometric titration method | GB 2123-1980 | 1981-10-1 |
| Determination of antimony content in selenium--Malachite green photometric method | GB 2111-1980 | 1981-10-1 |
| Determination of arsenic content in tellurium--n-butyl alcohol extraction arsenic-molybdenum blue photometric method | GB 2146-1980 | 1981-10-1 |
| Determination of magnesium and sodium contents in tellurium--Atomic absorption spectrophotometric method | GB 2144-1980 | 1981-10-1 |
