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Chinese National Standard Category: Semimetal and semiconductor material analysis method |
English Title: | Standard method for measuring radial resistivity variation on silicon slices |
Chinese Title: | 硅片径向电阻率变化的测量方法 |
Standard No.: | GB/T 11073-2007 |
Category No.: | H17 |
Issued by: | AQSIQ;SAC |
Issued on: | 2007-12-18 |
Implemented on: | 2008-2-1 |
Status: | valid |
Superseded by: | |
Superseded on: | |
Abolished on: | |
Superseding: | GB/T 11073-1989 Standard method for measuring radial resistivity variation on silicon slices |
Word Count: | 7000 words |
Similar Standards: | GB/T 1558-2023 GB/T 35306-2023 GB/T 24582-2023 GB/T 42263-2022 GB/T 42276-2022 GB/T 42274-2022 GB/T 24581-2022 GB/T 41153-2021 GB/T 39145-2020 GB/T 39144-2020 GB/T 38976-2020 GB/T 37385-2019 GB/T 37211.2-2018 GB/T 37211.1-2018 GB/T 4059-2018 GB/T 1557-2018 GB/T 4060-2018 GB/T 37049-2018 GB/T 35309-2017 GB/T 35306-2017 |
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