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Chinese National Standard Category: Semimetal and semiconductor material analysis method

English Title: Polycrystalline silicon—Examination method—Vacuum zone-melting on boron
Chinese Title: 硅多晶真空区熔基硼检验方法
Standard No.: GB/T 4060-2007
Category No.: H17
Issued by: AQSIQ,SAC
Issued on: 2007-12-18
Implemented on: 2008-2-1
Status: superseded
Superseded by:GB/T 4060-2018 Test method for boron content in polycrystalline silicon by vacuum zone-melting method
Superseded on:2019-6-1
Abolished on:
Superseding:GB/T 4060-1983 Polycrystalline silicon; Examination method; Vacuum zone-melting on boron
Word Count:4000 words
Similar Standards: GB/T 1558-2023   GB/T 35306-2023   GB/T 24582-2023   GB/T 42263-2022   GB/T 42276-2022   GB/T 42274-2022   GB/T 24581-2022   GB/T 41153-2021   GB/T 39145-2020   GB/T 39144-2020   GB/T 38976-2020   GB/T 37385-2019   GB/T 37211.2-2018   GB/T 37211.1-2018   GB/T 4059-2018   GB/T 1557-2018   GB/T 4060-2018   GB/T 37049-2018   GB/T 35309-2017   GB/T 35306-2017  
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