Chinese Classification
Professional Classification
ICS Classification
Latest
Value-added Services
|
Chinese National Standard Category: Semiconductor discrete devices in general |
English Title: | Semiconductor devices - Mechanical and climatic test methods - Part 2 : Low air pressure |
Chinese Title: | 半导体器件 机械和气候试验方法 第2部分:低气压 |
Standard No.: | GB/T 4937.2-2006 |
Category No.: | L40 |
Issued by: | SAC AQSIQ |
Issued on: | 2006-8-23 |
Implemented on: | 2007-2-1 |
Status: | superseded |
Superseded by: | GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices |
Superseded on: | 1996-8-1 |
Abolished on: | |
Superseding: | GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices |
Word Count: | 2500 words |
Similar Standards: | T/CIE 145-2022 T/CIE 116-2021 T/CIE 147-2022 T/CIE 119-2021 GB/T 4937.26-2023 GB/T 4587-2023 GB/T 42709.19-2023 GB/T 4937.42-2023 GB/T 4937.27-2023 GB/T 42709.7-2023 GB/T 4937.32-2023 GB/T 4937.31-2023 GB/T 4937.23-2023 GB/T 42706.5-2023 GB/T 42706.2-2023 GB/T 42709.5-2023 GB/T 4937.17-2018 GB/T 4937.30-2018 GB/T 4937.14-2018 GB/T 4937.15-2018 |
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886 |
Copyright: Foryou Tech Co., Ltd. 2008-2020 |