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Chinese National Standard Category: Nuclear detector

English Title: Test procedures for semiconductor charged particle detectors
Chinese Title: 带电粒子半导体探测器测量方法
Standard No.: GB/T 5201-2012
Category No.: F88
Issued by: AQSIQ,SAC
Issued on: 2012-6-29
Implemented on: 2012-11-1
Status: valid
Superseded by:
Superseded on:
Abolished on:
Superseding:GB/T 5201-1994 Test procedures for semiconductor charged particle detectors
Word Count:9000 words
Similar Standards: GB/T 40291-2021   GB/T 5201-2012   GB/T 28544-2012   JC/T 2018-2010   JC/T 2017-2010   GB/T 24247-2009   GB/T 23729-2009   GB/T 13179-2008   GB/T 13180-2008   GB/T 13376-2008   GB/T 7167-2008   GB/T 13178-2008   GB/T 9588-2008   GB/T 12564-2008   GB/T 13182-2007   GB/T 20131-2006   GB/T 7164-2004   GB/T 7164-1994   GB/T 13180-1991   GB/T 13179-1991  
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