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Chinese National Standard Category: Technical management |
English Title: | Method of measurement for input-to-output isolation resistance of semiconductor photocouplers |
Chinese Title: | 半导体光耦合器入出间绝缘电阻的测试方法 |
Standard No.: | SJ 2215.13-1982 |
Category No.: | M01 |
Issued by: | MOEI |
Issued on: | 1982-11-30 |
Implemented on: | 1983-7-1 |
Status: | superseded |
Superseded by: | SJ/T 2215-2015 Measuring methods for semiconductor photocouplers |
Superseded on: | 2015-10-1 |
Abolished on: | |
Superseding: | |
Word Count: | 1000 words |
Similar Standards: | YD XXX 4-1997 DB31/ 653-2012 DB31/ 652-2012 YD/T 1826-2008 YD/T 1827-2008 YD/T 1800-2008 YD/T 1293-2003 YD/T 996-1998 SJ/T 11167-1998 SJ/T 2307.1-1997 YD/T 931-1997 YD/T 932-1997 SJ 50033/99-1995 SJ 50033/94-1995 SJ 50033/101-1995 SJ 50033/100-1995 SJ 50033/95-1995 SJ 50033/93-1995 SJ 50033/97-1995 SJ 50033/96-1995 |
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