2025-12-17 10.9.52.83
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International Standard List: Semiconducting materials

GB/T 29055-2012 Multi-crystalline silicon wafer for solar cell 
  Issued on: 2012-12-31   Translation Price(USD): 120.0
YS/T 724-2009 Metallurgical silicon powder 
  Issued on: 2009-12-4   Translation Price(USD): 160.0
GB/T 35307-2017 Granular polysilicon produced by fluidized bed method 
  Issued on: 2017-12-29   Translation Price(USD): 100.0
YS/T 23-1992 Thickness determination for silicon epitaxial layers - Stacking fault method 
  Issued on: 1992-3-9   Translation Price(USD): 60.0
GB/T 1554-2009 Testing method for crystallographic perfection of silicon by preferential etch techniques 
  Issued on: 2009-10-30   Translation Price(USD): 360.0
GB/T 12963-1996 Polycrystalline silicon 
  Issued on: 1996-01-01   Translation Price(USD): 224.0
YS/T 24-1992 Test method for defects of extended nails 
  Issued on: 1992-3-9   Translation Price(USD): 30.0
GB/T 30861-2014 Germanium substrate for solar cell 
  Issued on: 2014-07-24   Translation Price(USD): 130.0
GB/T 14264-2009 Semiconductor materials - Terms and definitions 
  Issued on: 2009-10-30   Translation Price(USD): 720.0
YS/T 1061-2015 Silicon core for polysilicon by improved siemens method 
  Issued on: 2015-04-30   Translation Price(USD): 105.0
GB/T 26072-2010 Germanium single crystal for solar cell 
  Issued on: 2011-1-10   Translation Price(USD): 120.0
GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials 
  Issued on: 2009-10-30   Translation Price(USD): 150.0
GB/T 35308-2017 Epitaxial wafers of germanium based Ⅲ-Ⅴcompounds for solar cell 
  Issued on: 2017-12-29   Translation Price(USD): 220.0
YS/T 224-1994 Thallium 
  Issued on: 1982-3-1   Translation Price(USD): 30.0
GB/T 31854-2015 Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry 
  Issued on: 2015-07-03   Translation Price(USD): 140.0
GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 
  Issued on: 2003-06-16   Translation Price(USD): 90.0
GB/T 30453-2013 Metallographs Collection for Original Defects of Crystalline Silicon 
  Issued on: 2013-12-31   Translation Price(USD): 1200.0
GB/T 25076-2010 Monocrystalline silicon of solar cell 
  Issued on: 2010-9-2   Translation Price(USD): 180.0
GB/T 17170-1997 Test method for deep level EL2 concentration of undoped semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 
  Issued on: 1997-1-2   Translation Price(USD): 90.0
GB/T 29504-2013 300 mm monocrystalline silicon 
  Issued on: 2013-5-9   Translation Price(USD): 120.0
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