2025-12-17 10.9.52.83
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International Standard List: Semiconducting materials

YS/T 28-1992 Silicon wafer packaging 
  Issued on: 1992-3-9   Translation Price(USD): 184.0
GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells 
  Issued on: 2011-1-10   Translation Price(USD): 180.0
GB/T 16595-1996 Specification for a universal wafer grid 
  Issued on: 1996-1-1   Translation Price(USD): 234.0
GB/T 31474-2015 Soldering fluxes for high-quality interconnections in electronics assembly 
  Issued on: 2015-05-15   Translation Price(USD): 310.0
GB/T 30854-2014 Gallium nitride based epitaxial layer for LED lighting 
  Issued on: 2014-07-24   Translation Price(USD): 370.0
GB/T 29508-2013 300 mm monocrystalline silicon as cut slices and grinded slices 
  Issued on: 2013-5-9   Translation Price(USD): 140.0
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices 
  Issued on: 2009-10-30   Translation Price(USD): 140.0
YS/T 986-2014 Specification for serial alphanumeric marking of the front surface of wafers 
  Issued on: 2014-10-14   Translation Price(USD): 200.0
GB/T 29506-2013 300 mm polished monocrystalline silicon wafers 
  Issued on: 2013-5-9   Translation Price(USD): 160.0
GB/T 24576-2009 Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction 
  Issued on: 2009-10-30   Translation Price(USD): 170.0
GB/T 1558-1997 Test method for substitutional atomic carbon content of silicon by infrared absorption 
  Issued on: 1997-01-02   Translation Price(USD): 300.0
GB/T 26066-2010 Practice for shallow etch pit detection on silicon 
  Issued on: 2011-1-1   Translation Price(USD): 120.0
GB/T 25074-2017 Solar-grade polycrystalline silicon 
  Issued on: 2017-11-01   Translation Price(USD): 68.0
GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 
  Issued on: 2009-10-30   Translation Price(USD): 170.0
GB/T 25074-2010 Solar-grade polycrystalline silicon 
  Issued on: 2010-9-2   Translation Price(USD): 120.0
YS/T 982-2014 Carbon/carbon U shape heating element of hydrogenation furnace 
  Issued on: 2014-10-14   Translation Price(USD): 160.0
GB/T 24578-2009 Test method for measuring surface metal contamination on silicon wafers by total reflection X-ray fluorescence spectroscopy 
  Issued on: 2009-10-30   Translation Price(USD): 210.0
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method 
  Issued on: 2009-10-30   Translation Price(USD): 160.0
GB/T 35305-2017 Monocrystalline gallium arsenide polished wafers for solar cell 
  Issued on: 2017-12-29   Translation Price(USD): 160.0
GB/T 32573-2016 Silicon powder―Determination of total carbon content―Infrared absorption method after combustion in an induction furnace 
  Issued on: 2016-02-24   Translation Price(USD): 160.0
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