2025-12-17 10.9.52.83
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International Standard List: Semiconducting materials

YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage 
  Issued on: 2008-3-12   Translation Price(USD): 210.0
GB/T 16596-1996 Specification for establishing a wafer coordinate system 
  Issued on: 1996-1-1   Translation Price(USD): 75.0
YS/T 543-2006 Fine aluminum-1% silicon wire for semiconductor lend-bonding 
  Issued on: 2006-7-27   Translation Price(USD): 100.0
GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
YS/T 15-1991 Thcikness determination for silicon epitaxial layer and difussion layer - Angle lap-stain method 
  Issued on:   Translation Price(USD): 90.0
GB/T 32279-2015 pecification for order entry format of silicon wafers 
  Issued on: 2015-12-10   Translation Price(USD): 270.0
GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 
  Issued on: 2009-10-30   Translation Price(USD): 150.0
GB/T 30855-2014 GaP substrates for LED epitaxial chips 
  Issued on: 2014-07-24   Translation Price(USD): 220.0
YS/T 43-2011 High-purity arsenic 
  Issued on: 2011-12-20   Translation Price(USD): 120.0
GB/T 12962-1996 Monocrystalline silicon 
  Issued on: 1996-01-01   Translation Price(USD): 120.0
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal 
  Issued on: 1997-01-02   Translation Price(USD): 300.0
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities 
  Issued on: 2009-10-30   Translation Price(USD): 210.0
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick 
  Issued on: 2012-12-31   Translation Price(USD): 120.0
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy 
  Issued on: 2012-12-31   Translation Price(USD): 270.0
YS/T 43-1992 High-purity arsenic 
  Issued on: 1992-03-19   Translation Price(USD): 184.0
GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer 
  Issued on: 2013-5-9   Translation Price(USD): 430.0
GB/T 12964-2003 Monocrystalline silicon polished wafers 
  Issued on: 2003-6-1   Translation Price(USD): 150.0
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 
  Issued on: 2009-10-30   Translation Price(USD): 150.0
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