2025-12-18 10.9.52.83
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Code of China
International Standard List: Semiconducting materials

GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer 
  Issued on: 2007-12-18   Translation Price(USD): 180.0
YS/T 543-2006 Fine aluminum-1% silicon wire for semiconductor lend-bonding 
  Issued on: 2006-7-27   Translation Price(USD): 100.0
GB/T 20228-2006 Gallium arsenide single crystal 
  Issued on: 2006-4-21   Translation Price(USD): 124.0
GB/T 20229-2006 Gallium phosphide single crystal 
  Issued on: 2006-4-21   Translation Price(USD): 124.0
GB/T 20230-2006 Indium phosphide single crystal 
  Issued on: 2006-4-21   Translation Price(USD): 140.0
GB/T 12965-2005 Monocrystalline silicon as cut slices and lapped slices 
  Issued on: 2005-9-19   Translation Price(USD): 120.0
GB/T 12962-2005 Monoccrystalline silicon 
  Issued on: 2005-9-19   Translation Price(USD): 130.0
YS 68-2004 Arsenic 
  Issued on: 2004-06-17   Translation Price(USD): 60.0
SJ 20866-2003 Specification for cross-pressing molybdenum-rhenium alloy pieces 
  Issued on: 2003-12-25   Translation Price(USD): 100.0
GB/T 19199-2003 Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 
  Issued on: 2003-06-16   Translation Price(USD): 90.0
GB/T 12964-2003 Monocrystalline silicon polished wafers 
  Issued on: 2003-6-1   Translation Price(USD): 150.0
GB/T 8646-1998 Fine aluminum-1% silicon wire for semiconductor lend-bonding 
  Issued on: 1998-07-15   Translation Price(USD): 264.0
GB/T 17170-1997 Test method for deep level EL2 concentration of undoped semi-insulating monocrystal gallium arsenide by measurement infrared absorption method 
  Issued on: 1997-1-2   Translation Price(USD): 90.0
GB/T 1558-1997 Test method for substitutional atomic carbon content of silicon by infrared absorption 
  Issued on: 1997-01-02   Translation Price(USD): 300.0
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal 
  Issued on: 1997-01-02   Translation Price(USD): 300.0
GB/T 17169-1997 Test method for the surface quality of polished silicon wafers and epitaxial wafers by optical-reflection 
  Issued on: 1997-01-02   Translation Price(USD): 380.0
YS/T 99-1997 Arsenic trioxide 
  Issued on: 1997-5-15   Translation Price(USD): 150.0
GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices 
  Issued on: 1996-01-01   Translation Price(USD): 100.0
GB/T 12963-1996 Polycrystalline silicon 
  Issued on: 1996-01-01   Translation Price(USD): 224.0
GB/T 16595-1996 Specification for a universal wafer grid 
  Issued on: 1996-1-1   Translation Price(USD): 234.0
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