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International Standard Category: Semiconducting materials |
Category No.: | 29.045 | Valid Status: | superseded |
Issued Organization: | China Nonferrous Metals Industry Corporation | Issued Date: | 1992-3-9 |
Implemented Date: | 1993-1-1 | Abolished Date: | |
Superseded Standard.: | YS/T 23-2016 Test method for thickness of epitaxial layers-Stacking fault size |
Superseded Date: | 2016-9-1 |
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