2025-12-18 10.8.118.215
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances 180.0 via email in 1~3 business day valid,,2018-2-1
GB/T 19520.12-2009 Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482.6 mm (19 in) series - Part 3-101: Subracks and associated plug-in units 360.0 via email in 1~3 business day valid,,2009-12-1
GB/T 28275-2012 Silicon-based MEMS fabrication technology—Specification for KOH etch process 180.0 via email in 1~3 business day valid,,2012-12-1
QJ 3013-1998 Technical Requirements for Bonding and Sealing Process of Infrared Optical Products 150.0 via email in 1~3 business day valid,,1998-8-6
GB/T 3047.5-1989 20mm increments basic dimension series for cabiners 184.0 via email in 1~3 business day superseded2004-05-01,2004-5-1,1990-4-1
GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification 190.0 via email in 1~3 business day valid,,1996-8-1
GB/T 17562.8-2002 Rectangular connectors for frequencies below 3 MHz - Part 8: Detail specification for conectors, four-signal contacts and earthing contacts for cable screen 450.0 via email in 1~3 business day valid,,2003-5-1
SJ/Z 11351-2006 Integrated circuit IP core attributes with formats for profiling selection and transfer standard 750.0 via email in 1~3 business day abolished2024-07-11,,2006-12-1
GB/T 16601.2-2017 Lasers and laser-related equipment―Test methods for laser-induced damage threshold―Part 2: Threshold determination 495.0 via email in 1~3 business day superseded,1997-4-1,2018-7-1
GB/T 28571.1-2012 The telecom equipment cabinet—Part 1:General specification 420.0 via email in 1~3 business day valid,,2012-11-1
GB/T 5095.3-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods-Part 3: Current-carrying capacity tests 125.0 via email in 1~3 business day valid,,1998-10-1
JB/T 5842-2005 Rings for dies of semiconductor devices 150.0 via email in 1~3 business day valid,,2005-9-1
GB/T 14113-1993 of packages for semiconductor integrated circuits 180.0 via email in 1~3 business day valid,,1993-8-1
GB/T 16601.1-2017 Lasers and laser-related equipment―Test methods for laser-induced damage threshold―Part 1:Definitions and general principles 255.0 via email in 1~3 business day valid,,2018-7-1
GB/T 15431-1995 Generic specification for microcircuit modules 340.0 via email in 1~3 business day abolished2005-10-14 ,,1995-8-1
GB/T 18490.3-2017 Safety of machinery―Laser processing machines―Part 3:Noise reduction and noise measurement methods for laser processing machines and hand-held processing devices and associated auxiliary equipment (accuracy grade 2) 250.0 via email in 1~3 business day valid,,2018-7-1
GB/T 16601.4-2017 Lasers and laser-related equipment—Test methods for laser-induced damage threshold—Part 4:Inspection,detection and measurement 315.0 via email in 1~5 business day valid,,2018-7-1
GB/T 10320-2011 Electrical safety of laser equipment and installatins 480.0 via email in 1~3 business day valid,,2012-5-1
GB/T 4932-2000 Carbon dioxide laser series model of 300.0 via email in 1~3 business day abolished2005-10-14 ,,2000-8-1
GB/T 26113-2010 Micro-electromechanical system technology—General rules for the assessment of micro-geometrical parameters 130.0 via email in 1~3 business day valid,,2011-7-1
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GB/T 33922-2017 Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances 
  Issued on: 2017-07-12   Price(USD): 180.0
GB/T 19520.12-2009 Mechanical structures for electronic equipment - Dimensions of mechanical structures of the 482.6 mm (19 in) series - Part 3-101: Subracks and associated plug-in units 
  Issued on: 2009-3-19   Price(USD): 360.0
GB/T 28275-2012 Silicon-based MEMS fabrication technology—Specification for KOH etch process 
  Issued on: 2012-5-11   Price(USD): 180.0
QJ 3013-1998 Technical Requirements for Bonding and Sealing Process of Infrared Optical Products 
  Issued on: 1998-02-06   Price(USD): 150.0
GB/T 3047.5-1989 20mm increments basic dimension series for cabiners 
  Issued on: 1989-06-01   Price(USD): 184.0
GB/T 15873-1995 Directives for drafting semiconductor facilities interface specification 
  Issued on: 1995-1-2   Price(USD): 190.0
GB/T 17562.8-2002 Rectangular connectors for frequencies below 3 MHz - Part 8: Detail specification for conectors, four-signal contacts and earthing contacts for cable screen 
  Issued on: 2002-12-4   Price(USD): 450.0
SJ/Z 11351-2006 Integrated circuit IP core attributes with formats for profiling selection and transfer standard 
  Issued on: 2006-9-26   Price(USD): 750.0
GB/T 16601.2-2017 Lasers and laser-related equipment―Test methods for laser-induced damage threshold―Part 2: Threshold determination 
  Issued on: 2017-12-29   Price(USD): 495.0
GB/T 28571.1-2012 The telecom equipment cabinet—Part 1:General specification 
  Issued on: 2012-6-29   Price(USD): 420.0
GB/T 5095.3-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods-Part 3: Current-carrying capacity tests 
  Issued on: 1997-01-02   Price(USD): 125.0
JB/T 5842-2005 Rings for dies of semiconductor devices 
  Issued on: 2005-3-19   Price(USD): 150.0
GB/T 14113-1993 of packages for semiconductor integrated circuits 
  Issued on: 1993-1-21   Price(USD): 180.0
GB/T 16601.1-2017 Lasers and laser-related equipment―Test methods for laser-induced damage threshold―Part 1:Definitions and general principles 
  Issued on: 2017-12-29   Price(USD): 255.0
GB/T 15431-1995 Generic specification for microcircuit modules 
  Issued on: 1995-01-06   Price(USD): 340.0
GB/T 18490.3-2017 Safety of machinery―Laser processing machines―Part 3:Noise reduction and noise measurement methods for laser processing machines and hand-held processing devices and associated auxiliary equipment (accuracy grade 2) 
  Issued on: 2017-12-29   Price(USD): 250.0
GB/T 16601.4-2017 Lasers and laser-related equipment—Test methods for laser-induced damage threshold—Part 4:Inspection,detection and measurement 
  Issued on: 2017-12-29   Price(USD): 315.0
GB/T 10320-2011 Electrical safety of laser equipment and installatins 
  Issued on: 2011-12-30   Price(USD): 480.0
GB/T 4932-2000 Carbon dioxide laser series model of 
  Issued on: 2000-01-03   Price(USD): 300.0
GB/T 26113-2010 Micro-electromechanical system technology—General rules for the assessment of micro-geometrical parameters 
  Issued on: 2011-1-10   Price(USD): 130.0
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