Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
GB/T 35004-2018 |
Logic digital integrated circuits—Specification for I/O interface model for integrated circuit |
$810.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35005-2018 |
Test methods for flip chip integrated circuits |
$290.00 |
via email in 1~3 business day |
valid,,2018-8-1 |
|
GB/T 35006-2018 |
Semiconductor integrated circuits—Measuring method of level converter |
$430.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35007-2018 |
Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry |
$550.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35008-2018 |
Specification for serial NOR flash interface |
$490.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35009-2018 |
Specification for serial NAND flash interface |
$400.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35010.1-2018 |
Semiconductor die products—Part 1:Requirements for procurement and use |
$550.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35010.2-2018 |
Semiconductor die products—Part 2:Exchange data formats |
$870.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35010.3-2018 |
Semiconductor die products—Part 3: Guide for handling, packing and storage |
$430.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35010.4-2018 |
Semiconductor die products—Part 4: Requirements for die users and suppliers |
$250.00 |
via email in 1~3 business day |
valid,,2018-8-1 |
|
GB/T 35010.5-2018 |
Semiconductor die products—Part 5:Requirements for concerning electrical simulation |
$160.00 |
via email in 1~3 business day |
valid,,2018-8-1 |
|
GB/T 35010.6-2018 |
Semiconductor die products—Part 6:Requirements for concerning thermal simulation |
$80.00 |
via email in 1~3 business day |
valid,,2018-8-1 |
|
GB/T 35010.7-2018 |
Semiconductor die products—Part 7:XML schema for data exchange |
$490.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35010.8-2018 |
Semiconductor die products—Part 8:EXPRESS model schema for data exchange |
$370.00 |
via email in 1~5 business day |
valid,,2018-8-1 |
|
GB/T 35011-2018 |
Microwave circuits—Measuring methods for voltage controlled oscillater |
$250.00 |
via email in 1~3 business day |
valid,,2018-8-1 |
|
GB/T 35086-2018 |
General specification for MEMS electric field sensor |
$250.00 |
via email in 1~3 business day |
valid,,2018-12-1 |
|
GB/T 35118-2017 |
Test methods of optical performance for Erbium-doped Yttrium Aluminum Garnet laser crystal |
$165.00 |
via email in 1~3 business day |
valid,,2018-7-1 |
|
GB/T 36005-2018 |
Measuring methods of optical radiation safety for semiconductor lighting equipments and systems |
$164.00 |
via email in 1~3 business day |
valid,,2018-10-1 |
|
GB/T 36356-2018 |
Technical specification for power light-emitting diode chips |
$250.00 |
via email in 1~3 business day |
valid,,2019-1-1 |
|
GB/T 36357-2018 |
Technical specification for middle power light-emitting diode chips |
$250.00 |
via email in 1~5 business day |
valid,,2019-1-1 |
|
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