2026-3-15 10.6.5.91
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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Standard No. Title Price(USD) Delivery Status Add to Cart
GB 44703-2024 General requirements for optical radiation safety 435.0 via email in 1 business day to be valid,,2026-10-1
GB/T 6115.3-2026 Series capacitors for power systems—Part 1:General 270.0 via email in 1~3 business day to be valid,,2026-8-1
GB/T 6115.1-2026 Series capacitors for power systems—Part 1:General 795.0 via email in 1~8 business day to be valid,,2026-8-1
GB/T 44807.3-2025 EMC IC modelling—Part 3: Models of integrated circuits for EMI behavioural simulation—Radiated emissions modelling (ICEM-RE) 1335.0 via email in 1~10 business day to be valid,,2026-7-1
GB/T 33772.3-2025 Quality assessment systems—Part 3: Selection and use of sampling plans for printed board and laminate end-product and in-process auditing 660.0 via email in 1~8 business day to be valid,,2026-7-1
GB/T 19405.4-2025 Surface mounting technology—Part 4: Classification; packaging; labelling and handling of moisture sensitive devices 435.0 via email in 1~5 business day to be valid,,2026-7-1
GB/T 4937.39-2025 Semiconductor devices—Mechanical and climatic test methods—Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components 315.0 via email in 1~5 business day to be valid,,2026-7-1
GB/T 4937.40-2025 Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge 375.0 via email in 1~5 business day to be valid,,2026-7-1
GB/T 6346.2301-2025 Fixed capacitors for use in electronic equipment—Part 23-1: Blank detail specification—Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors—Assessment level EZ 375.0 via email in 1~5 business day to be valid,,2026-7-1
GB/T 6346.23-2025 Fixed capacitors for use in electronic equipment—Part 23:Sectional specification—Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors 660.0 via email in 1~8 business day to be valid,,2026-7-1
GB/T 22319.8-2025 Measurement of quartz crystal unit parameters—Part 8: Test fixture for surface mounted quartz crystal units 270.0 via email in 1~3 business day to be valid,,2026-7-1
GB/T 46696-2025 Specification for permanent solder mask 315.0 via email in 1~5 business day to be valid,,2026-7-1
GB/T 4937.44-2025 Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices 255.0 via email in 1~3 business day to be valid,,2026-7-1
GB/T 4937.33-2025 Semiconductor devices—Mechanical and climatic test methods—Part 33: Accelerated moisture resistance—Unbiased autoclave 165.0 via email in 1~3 business day to be valid,,2026-7-1
GB/T 4937.38-2025 Semiconductor devices—Mechanical and climatic test methods—Part 38: Soft error test method for semiconductor devices with memory 225.0 via email in 1~3 business day to be valid,,2026-7-1
GB/T 4937.36-2025 Semiconductor devices—Mechanical and climatic test methods—Part 36:Acceleration，steady state 165.0 via email in 1~3 business day to be valid,,2026-7-1
GB/T 42706.4-2025 Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage 315.0 via email in 1~5 business day to be valid,,2026-5-1
GB/T 37946.1-2025 Test methods for organic luminescence material - Part 1: Optical tests 270.0 via email in 1~3 business day to be valid,,2026-5-1
GB/T 18334-2025 Specification for flexible multilayer printed boards 690.0 via email in 1~8 business day to be valid,,2026-5-1
GB/T 4937.16-2025 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection(PIND) 270.0 via email in 1~3 business day to be valid,,2026-5-1
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GB 44703-2024 General requirements for optical radiation safety 
  Issued on: 2024-9-29   Price(USD): 435.0
GB/T 6115.3-2026 Series capacitors for power systems—Part 1:General 
  Issued on: 2026-01-28   Price(USD): 270.0
GB/T 6115.1-2026 Series capacitors for power systems—Part 1:General 
  Issued on: 2026-01-28   Price(USD): 795.0
GB/T 44807.3-2025 EMC IC modelling—Part 3: Models of integrated circuits for EMI behavioural simulation—Radiated emissions modelling (ICEM-RE) 
  Issued on: 2025-12-31   Price(USD): 1335.0
GB/T 33772.3-2025 Quality assessment systems—Part 3: Selection and use of sampling plans for printed board and laminate end-product and in-process auditing 
  Issued on: 2025-12-31   Price(USD): 660.0
GB/T 19405.4-2025 Surface mounting technology—Part 4: Classification; packaging; labelling and handling of moisture sensitive devices 
  Issued on: 2025-12-31   Price(USD): 435.0
GB/T 4937.39-2025 Semiconductor devices—Mechanical and climatic test methods—Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components 
  Issued on: 2025-12-31   Price(USD): 315.0
GB/T 4937.40-2025 Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge 
  Issued on: 2025-12-31   Price(USD): 375.0
GB/T 6346.2301-2025 Fixed capacitors for use in electronic equipment—Part 23-1: Blank detail specification—Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors—Assessment level EZ 
  Issued on: 2025-12-31   Price(USD): 375.0
GB/T 6346.23-2025 Fixed capacitors for use in electronic equipment—Part 23:Sectional specification—Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors 
  Issued on: 2025-12-31   Price(USD): 660.0
GB/T 22319.8-2025 Measurement of quartz crystal unit parameters—Part 8: Test fixture for surface mounted quartz crystal units 
  Issued on: 2025-12-31   Price(USD): 270.0
GB/T 46696-2025 Specification for permanent solder mask 
  Issued on: 2025-12-2   Price(USD): 315.0
GB/T 4937.44-2025 Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices 
  Issued on: 2025-12-2   Price(USD): 255.0
GB/T 4937.33-2025 Semiconductor devices—Mechanical and climatic test methods—Part 33: Accelerated moisture resistance—Unbiased autoclave 
  Issued on: 2025-12-2   Price(USD): 165.0
GB/T 4937.38-2025 Semiconductor devices—Mechanical and climatic test methods—Part 38: Soft error test method for semiconductor devices with memory 
  Issued on: 2025-12-2   Price(USD): 225.0
GB/T 4937.36-2025 Semiconductor devices—Mechanical and climatic test methods—Part 36:Acceleration，steady state 
  Issued on: 2025-12-2   Price(USD): 165.0
GB/T 42706.4-2025 Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage 
  Issued on: 2025-10-31   Price(USD): 315.0
GB/T 37946.1-2025 Test methods for organic luminescence material - Part 1: Optical tests 
  Issued on: 2025-10-31   Price(USD): 270.0
GB/T 18334-2025 Specification for flexible multilayer printed boards 
  Issued on: 2025-10-31   Price(USD): 690.0
GB/T 4937.16-2025 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection(PIND) 
  Issued on: 2025-10-31   Price(USD): 270.0
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