2025-12-14 10.2.82.121
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 46223-2025 Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis 570.0 via email in 1~5 business day to be valid,,2026-3-1
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) 315.0 via email in 1~5 business day to be valid,,2026-3-1
T/COEMA 22O-2025 Photothermal-Lensing absorption measuring instrument (PLI) via email in business day valid,,2025-3-5
GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal 480.0 via email in 1~5 business day valid,,2024-11-1
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips 225.0 via email in 1~3 business day valid,,2024-10-1
ZB N 33005-1988 120.0 via email in 1~3 business day superseded,2000-1-1,1989-7-1
ZB N 33003-1988 via email in business day superseded,2000-1-1,1989-7-1
ZB N 33010-1989 via email in business day superseded,2000-1-1,1990-1-1
ZB N 33008-1989 via email in business day superseded,2000-1-1,1990-1-1
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy 375.0 via email in 1~5 business day valid,,2024-7-1
GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials 700.0 via email in 1~5 business day valid,,2024-4-1
GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy 255.0 via email in 1~3 business day valid,,2023-7-1
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis 210.0 via email in 1~3 business day valid,,2023-2-1
DZ 0030-1992 XDY-1 dual channel atomic fluorescence spectrometer technical conditions via email in 1~3 business day valid,,1992-9-24
DZ 0029-1992 Microcomputer HYX-3 X-ray fluorescence analyzer via email in 1~3 business day valid,,1992-9-24
JB/T 5522-1991 Optical Transfer Function Application - 35 mm Camera Interchangeable Lens 60.0 via email in 1~3 business day valid,,1992-7-1
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method 224.0 via email in 1~3 business day to be superseded,2026-1-1,2004-12-1
JB/T 9322-1999 Spectrum projector 260.0 via email in 1~3 business day abolished2010-01-20 ,,2000-1-1
GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope 264.0 via email in 1~3 business day superseded,2009-3-1,1999-7-1
JB/T 6779-1993 Infrared Spectrophotometer 120.0 via email in 1~3 business day abolished2017-05-12 ,,1994-1-1
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GB/T 46223-2025 Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis 
  Issued on: 2025-8-29   Price(USD): 570.0
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) 
  Issued on: 2025-8-29   Price(USD): 315.0
T/COEMA 22O-2025 Photothermal-Lensing absorption measuring instrument (PLI) 
  Issued on: 2025-02-25   Price(USD):
GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal 
  Issued on: 2024-4-25   Price(USD): 480.0
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips 
  Issued on: 2024-3-15   Price(USD): 225.0
ZB N 33005-1988  
  Issued on:   Price(USD): 120.0
ZB N 33003-1988  
  Issued on:   Price(USD):
ZB N 33010-1989  
  Issued on:   Price(USD):
ZB N 33008-1989  
  Issued on:   Price(USD):
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy 
  Issued on: 2023-12-28   Price(USD): 375.0
GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials  
  Issued on: 2023-09-07   Price(USD): 700.0
GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy 
  Issued on: 2022-12-30   Price(USD): 255.0
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis 
  Issued on: 2022-10-12   Price(USD): 210.0
DZ 0030-1992 XDY-1 dual channel atomic fluorescence spectrometer technical conditions 
  Issued on:   Price(USD):
DZ 0029-1992 Microcomputer HYX-3 X-ray fluorescence analyzer 
  Issued on:   Price(USD):
JB/T 5522-1991 Optical Transfer Function Application - 35 mm Camera Interchangeable Lens 
  Issued on: 1991-7-16   Price(USD): 60.0
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method 
  Issued on: 2004-4-30   Price(USD): 224.0
JB/T 9322-1999 Spectrum projector 
  Issued on: 1999-08-06   Price(USD): 260.0
GB/T 17507-1998 General specification of thin biological STANDARDs for X-ray EDS microanalysis in electron microscope 
  Issued on: 1998-10-16   Price(USD): 264.0
JB/T 6779-1993 Infrared Spectrophotometer 
  Issued on: 1993-7-9   Price(USD): 120.0
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