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GB/T 26059-2010 Titanium and titanium alloy halftone
Issued on: 2011-1-10 Price(USD): 160.0 |
GB/T 26060-2010 Titanium and titanium alloy ingots
Issued on: 2011-1-10 Price(USD): 160.0 |
GB/T 26061-2010 Tantalum-niobium composite carbides
Issued on: 2011-1-10 Price(USD): 120.0 |
GB/T 26062-2010 Niobium and niobium-zirconium alloy wire
Issued on: 2011-1-10 Price(USD): 140.0 |
GB/T 26063-2010 Beryllium aluminum alloy
Issued on: 2011-1-10 Price(USD): 120.0 |
GB/T 26063-2023 Beryllium aluminium alloy
Issued on: 2023-08-06 Price(USD): 165.0 |
GB/T 26064-2010 Lithium wafers
Issued on: 2011-1-10 Price(USD): 140.0 |
GB/T 26065-2010 Specification for polished test silicon wafers
Issued on: 2011-1-10 Price(USD): 300.0 |
GB/T 26066-2010 Practice for shallow etch pit detection on silicon
Issued on: 2011-1-1 Price(USD): 120.0 |
GB/T 26067-2010 Standard test method for dimensions of notches on silicon wafers
Issued on: 2011-1-10 Price(USD): 180.0 |
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
Issued on: 2011-1-10 Price(USD): 390.0 |
GB/T 26068-2018 Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method
Issued on: 2018-12-28 Price(USD): 435.0 |
GB/T 26069-2010 Specification for silicon annealed wafers
Issued on: 2011-1-10 Price(USD): 180.0 |
GB/T 26069-2022 Annealed monocrystalline silicon wafers
Issued on: 2022-03-09 Price(USD): 165.0 |
GB/T 26070-2010 Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
Issued on: 2011-1-10 Price(USD): 240.0 |
GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells
Issued on: 2011-1-10 Price(USD): 180.0 |
GB/T 26071-2018 Monocrystalline silicon wafers for solar cells
Issued on: 2018-09-17 Price(USD): 160.0 |
GB/T 26072-2010 Germanium single crystal for solar cell
Issued on: 2011-1-10 Price(USD): 120.0 |
GB/T 26073-2010 Safety guideline for the evaluation of toxic and flammable gas detection systems
Issued on: 2011-1-10 Price(USD): 180.0 |
GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
Issued on: 2011-1-10 Price(USD): 160.0 |
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