2025-12-17 10.9.52.83
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International Standard List: Semiconducting materials

GB/T 30656-2014 Polished monocrystalline silicon carbide wafers 
  Issued on: 2014-12-31   Translation Price(USD): 220.0
YS/T 985-2014 Polished reclaimed silicon wafers 
  Issued on: 2014-10-14   Translation Price(USD): 220.0
YS/T 978-2014 Carbon/carbon composites guide shield of single crystal furnace 
  Issued on: 2014-10-14   Translation Price(USD): 160.0
GB/T 20228-2006 Gallium arsenide single crystal 
  Issued on: 2006-4-21   Translation Price(USD): 124.0
GB/T 29849-2013 Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry 
  Issued on: 2013-11-12   Translation Price(USD): 160.0
GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay 
  Issued on: 2009-10-30   Translation Price(USD): 210.0
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 
  Issued on: 2011-1-10   Translation Price(USD): 390.0
GB/T 12962-2015 Monocrystalline silicon 
  Issued on: 2015-12-10   Translation Price(USD): 160.0
GB/T 8646-1998 Fine aluminum-1% silicon wire for semiconductor lend-bonding 
  Issued on: 1998-07-15   Translation Price(USD): 264.0
GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance 
  Issued on: 2011-1-10   Translation Price(USD): 180.0
GB/T 4058-2009 Test method for detection of oxidation induced defects in polished silicon wafers 
  Issued on: 2009-10-30   Translation Price(USD): 300.0
GB/T 2881-2014 Silicon metal 
  Issued on: 2014-12-05   Translation Price(USD): 140.0
GB/T 2881-2008 Silicon metal 
  Issued on: 2008-3-31   Translation Price(USD): 80.0
GB/T 12964-1996 Monocrystalline silicon polished wafers 
  Issued on: 1996-11-04   Translation Price(USD): 130.0
YS/T 979-2014 High purity gallium oxide 
  Issued on: 2014-10-14   Translation Price(USD): 100.0
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array 
  Issued on: 2009-10-30   Translation Price(USD): 180.0
YS/T 99-1997 Arsenic trioxide 
  Issued on: 1997-5-15   Translation Price(USD): 150.0
YS/T 838-2012 Cadmium Telluride 
  Issued on: 2012-11-7   Translation Price(USD): 210.0
GB/T 26067-2010 Standard test method for dimensions of notches on silicon wafers 
  Issued on: 2011-1-10   Translation Price(USD): 180.0
YS/T 26-1992 Test method for silicon wafer edge 
  Issued on: 1992-3-9   Translation Price(USD): 60.0
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