2025-12-13 10.2.82.121
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 13584-2011 Measuring methods for paramaters of infrared detectors 480.0 via email in 1~3 business day valid,,2012-7-1
GB/T 22764.5-2008 Cabinets for low-voltage switchgear—Part 5:Basic test methods 150.0 via email in 1~3 business day valid,,2009-10-1
GB/T 5095.1-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods - Part 1: General 150.0 via email in 1~3 business day valid,,1998-10-1
GB/T 7247.5-2017 Safety of laser products―Part 5:Manufacturer’s checklist for GB 7247.1 310.0 via email in 1~5 business day superseded,2025-3-1,2018-7-1
SJ 20872-2003 Switch electromatice waveguide type KDB9001 detail specification for 130.0 via email in 1~3 business day valid,,2004-3-1
SJ/T 11133-1997 Generic specification for flexible flat cables connectors 180.0 via email in 1~3 business day valid,,1998-1-1
GB/T 3047.4-1986 Series of basic dimensions of subracks and plug-in units for vertical increment of 44. 45mm 824.0 via email in business day superseded2005-02-01,2005-2-1,1987-1-1
GB/T 13708-1992 Blank detail specification for photomultiplier tubes 100.0 via email in 1~3 business day superseded2009-04-01,2009-4-1,1993-6-1
GB/T 3047.6-2007 Series of basic dimensions of cases for electronic equipment 100.0 via email in 1~3 business day valid,,2007-8-1
GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits 330.0 via email in 1~3 business day valid,,2007-2-1
GB/T 13067-1991 Series and products for semiconductor integrated circuits--Products for use in quartz electronic clock and watch 904.0 via email in 1~5 business day abolished2005-10-14 ,,1992-3-1
GB/T 33657-2017 Nanotechnologies―Electrical operating parameter test specification of wafer level nano-scale phase change memory cells 220.0 via email in 1~3 business day valid,,2017-12-1
GB/T 19247.1-2003 Printed board assemblies - Part 1: Generic specification - Requirements for soldered electrical and electronic assemblies using surface mount and related assembly technologies 520.0 via email in 1~3 business day valid,,2003-10-1
GB/T 31359-2015 Test methods of semiconductor lasers 470.0 via email in 1~5 business day valid,,2015-8-1
GB 5295-1985 The spectral response characteristic series of photocathodes 240.0 via email in 1~3 business day superseded2013-02-15 ,2013-2-15,1986-3-1
GB/T 15876-1995 Specification of leadframes for plastic quad flat package 224.0 via email in 1~3 business day superseded2016-01-01,2016-1-1,1996-8-1
SJ 20954-2006 Integrated circuits latch-up test 220.0 via email in 1~3 business day valid,,2006-12-30
GB/T 18500.1-2001 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC) 240.0 via email in 1~3 business day valid,,2002-6-1
GB 11498-1989 Sectional specification for Film Integrated circuits and Hybrid Film Integrated circuits on the Basis of the Qualification Approval Procedure 135.0 via email in 1~3 business day superseded,2019-7-1,1990-4-1
GB 9178-1988 Terminology for integrated circuits 1200.0 via email in 1~3 business day valid,,1988-10-1
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GB/T 13584-2011 Measuring methods for paramaters of infrared detectors 
  Issued on: 2011-12-30   Price(USD): 480.0
GB/T 22764.5-2008 Cabinets for low-voltage switchgear—Part 5:Basic test methods 
  Issued on: 2008-12-30   Price(USD): 150.0
GB/T 5095.1-1997 Electromechanical components for electronic equipment Basic testing procedures and measuring methods - Part 1: General 
  Issued on: 1997-1-2   Price(USD): 150.0
GB/T 7247.5-2017 Safety of laser products―Part 5:Manufacturer’s checklist for GB 7247.1 
  Issued on: 2017-12-29   Price(USD): 310.0
SJ 20872-2003 Switch electromatice waveguide type KDB9001 detail specification for 
  Issued on: 2003-12-25   Price(USD): 130.0
SJ/T 11133-1997 Generic specification for flexible flat cables connectors 
  Issued on: 1997-09-03   Price(USD): 180.0
GB/T 3047.4-1986 Series of basic dimensions of subracks and plug-in units for vertical increment of 44. 45mm 
  Issued on: 1986-04-04   Price(USD): 824.0
GB/T 13708-1992 Blank detail specification for photomultiplier tubes 
  Issued on: 1992-10-04   Price(USD): 100.0
GB/T 3047.6-2007 Series of basic dimensions of cases for electronic equipment 
  Issued on: 2007-4-25   Price(USD): 100.0
GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits 
  Issued on: 2006-8-23   Price(USD): 330.0
GB/T 13067-1991 Series and products for semiconductor integrated circuits--Products for use in quartz electronic clock and watch 
  Issued on: 1991-07-06   Price(USD): 904.0
GB/T 33657-2017 Nanotechnologies―Electrical operating parameter test specification of wafer level nano-scale phase change memory cells 
  Issued on: 2017-05-12   Price(USD): 220.0
GB/T 19247.1-2003 Printed board assemblies - Part 1: Generic specification - Requirements for soldered electrical and electronic assemblies using surface mount and related assembly technologies 
  Issued on: 2003-7-2   Price(USD): 520.0
GB/T 31359-2015 Test methods of semiconductor lasers 
  Issued on: 2015-02-04   Price(USD): 470.0
GB 5295-1985 The spectral response characteristic series of photocathodes 
  Issued on: 1985-8-22   Price(USD): 240.0
GB/T 15876-1995 Specification of leadframes for plastic quad flat package 
  Issued on: 1995-01-02   Price(USD): 224.0
SJ 20954-2006 Integrated circuits latch-up test 
  Issued on: 2006-8-7   Price(USD): 220.0
GB/T 18500.1-2001 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC) 
  Issued on: 2001-1-1   Price(USD): 240.0
GB 11498-1989 Sectional specification for Film Integrated circuits and Hybrid Film Integrated circuits on the Basis of the Qualification Approval Procedure 
  Issued on: 1989-03-18   Price(USD): 135.0
GB 9178-1988 Terminology for integrated circuits 
  Issued on: 1988-5-19   Price(USD): 1200.0
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