Standard No.:	GB/T 25185-2010
English Name:	Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
Chinese Name:	表面化学分析——X射线光电子能谱-荷电控制和荷电校正方法的报告
Chinese Classification:	G04    Basic standards and general methods
Professional Classification:	GB    National Standard
ICS Classification:	71.040.40 71.040.40    Chemical analysis 71.040.40
Source Content Issued by:	AQSIQ; SAC
Issued on:	2010-9-26
Implemented on:	2011-8-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7000 words
Translation Price(USD):	190.0
Delivery:	via email in 1~3 business day

本标准以最少量的资料描述了用X射线光电子能谱测量绝缘样品内能级结合能,及将在报告其分析结果时所采用的荷电控制和荷电校正方法,也给出了在结合能测量过程中对于荷电控制和荷电校正有用的方法资料。