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Position: Chinese Standard in English/GB/T 30701-2014
GB/T 30701-2014   Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy (English Version)
Standard No.: GB/T 30701-2014 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 10500 words Translation Price(USD):310.0 remind me the price change

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Implemented on:2014-12-1 Delivery: via email in 1~5 business day

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,,2014-12-1,FC29231F356D8C831418973342940
Standard No.: GB/T 30701-2014
English Name: Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
Chinese Name: 表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定
Chinese Classification: G04    Basic standards and general methods
Professional Classification: GB    National Standard
ICS Classification: 71.040.40 71.040.40    Chemical analysis 71.040.40
Source Content Issued by: AQSIQ; SAC
Issued on: 2014-06-09
Implemented on: 2014-12-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 10500 words
Translation Price(USD): 310.0
Delivery: via email in 1~5 business day
Code of China
Standard
GB/T 30701-2014  Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy (English Version)
Standard No.GB/T 30701-2014
Statusvalid
LanguageEnglish
File FormatPDF
Word Count10500 words
Price(USD)310.0
Implemented on2014-12-1
Deliveryvia email in 1~5 business day
Detail of GB/T 30701-2014
Standard No.
GB/T 30701-2014
English Name
Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
Chinese Name
表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定
Chinese Classification
G04
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2014-06-09
Implemented on
2014-12-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
10500 words
Price(USD)
310.0
Keywords
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Introduction of GB/T 30701-2014
Contents of GB/T 30701-2014
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Keywords:
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