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Position: Chinese Standard in English/GB/T 36401-2018
GB/T 36401-2018   Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis (English Version)
Standard No.: GB/T 36401-2018 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 20500 words Translation Price(USD):610.0 remind me the price change

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Implemented on:2019-5-1 Delivery: via email in 1~5 business day

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,,2019-5-1,E1B65CD2F7BCC8161530432368119
Standard No.: GB/T 36401-2018
English Name: Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
Chinese Name: 表面化学分析 X射线光电子能谱 薄膜分析结果的报告
Chinese Classification: G04    Basic standards and general methods
Professional Classification: GB    National Standard
ICS Classification: 71.040.40 71.040.40    Chemical analysis 71.040.40
Source Content Issued by: SAMR; SAC
Issued on: 2018-06-07
Implemented on: 2019-5-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 20500 words
Translation Price(USD): 610.0
Delivery: via email in 1~5 business day
本标准给出了采用XPS对基材上薄膜的分析报告所需的最少信息量要求的说明。这些分析涉及化学组成和均匀薄膜厚度的测量,以及采用变角XPS、XPS溅射深度剖析、峰形分析和可变光子能量XPS的方式对非均匀薄膜作为深度函数的化学组成的测量。
Code of China
Standard
GB/T 36401-2018  Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis (English Version)
Standard No.GB/T 36401-2018
Statusvalid
LanguageEnglish
File FormatPDF
Word Count20500 words
Price(USD)610.0
Implemented on2019-5-1
Deliveryvia email in 1~5 business day
Detail of GB/T 36401-2018
Standard No.
GB/T 36401-2018
English Name
Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
Chinese Name
表面化学分析 X射线光电子能谱 薄膜分析结果的报告
Chinese Classification
G04
Professional Classification
GB
ICS Classification
Issued by
SAMR; SAC
Issued on
2018-06-07
Implemented on
2019-5-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
20500 words
Price(USD)
610.0
Keywords
GB/T 36401-2018, GB 36401-2018, GBT 36401-2018, GB/T36401-2018, GB/T 36401, GB/T36401, GB36401-2018, GB 36401, GB36401, GBT36401-2018, GBT 36401, GBT36401
Introduction of GB/T 36401-2018
本标准给出了采用XPS对基材上薄膜的分析报告所需的最少信息量要求的说明。这些分析涉及化学组成和均匀薄膜厚度的测量,以及采用变角XPS、XPS溅射深度剖析、峰形分析和可变光子能量XPS的方式对非均匀薄膜作为深度函数的化学组成的测量。
Contents of GB/T 36401-2018
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