GB/T 4937.3-2012 English Version, GB/T 4937.3-2012 Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination (English Version)

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GB/T 4937.3-2012 Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination (English Version)
Standard No.:	GB/T 4937.3-2012	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	4000 words	Translation Price(USD):	90.0 remind me the price change Email:
Implemented on:	2013-2-15	Delivery:	via email in 1~3 business day

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Standard No.:	GB/T 4937.3-2012
English Name:	Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination
Chinese Name:	半导体器件机械和气候试验方法第3部分：外部目检
Chinese Classification:	L40 Semiconductor discrete devices in general
Professional Classification:	GB National Standard
Source Content Issued by:	AQSIQ;SAC
Issued on:	2012-11-5
Implemented on:	2013-2-15
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	4000 words
Translation Price(USD):	90.0
Delivery:	via email in 1~3 business day

Standard

GB/T 4937.3-2012 Semiconductor devices - Mechanical and climatic tests methods - Part 3: External visual examination (English Version)
Standard No.	GB/T 4937.3-2012
Status	valid
Language	English
File Format	PDF
Word Count	4000 words
Price(USD)	90.0
Implemented on	2013-2-15
Delivery	via email in 1~3 business day

Detail of GB/T 4937.3-2012

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Introduction of GB/T 4937.3-2012

T 4937的本部分的目的是验证半导体器件的材料、设计、结构、标志和工艺质量是否符合适用的采购文件的要求。外部目检是非破坏性试验，适用于所有的封装类型。本试验用于鉴定检验、过程监控、批接收。

Contents of GB/T 4937.3-2012

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