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| Position: Chinese Standard in English/GB/Z 107-2025 |
| GB/Z 107-2025 Semiconductor devices—Scan based ageing level estimation for semiconductor devices (English Version) | |||
| Standard No.: | GB/Z 107-2025 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | Translation Price(USD): | remind me the price change | |
| Implemented on: | 2025-12-3 | Delivery: | |
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| Standard No.: | GB/Z 107-2025 |
| English Name: | Semiconductor devices—Scan based ageing level estimation for semiconductor devices |
| Chinese Name: | 半导体器件 基于扫描的半导体器件退化水平评估 |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SAMR;SAC |
| Issued on: | 2025-12-03 |
| Implemented on: | 2025-12-3 |
| Status: | valid |
| Target Language: | English |
| File Format: |