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| Position: Chinese Standard in English/SJ 1551-1979 |
| SJ 1551-1979 Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional) (English Version) | |||
| Standard No.: | SJ 1551-1979 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5000 words | Translation Price(USD): | 184.0 remind me the price change |
| Implemented on: | 1980-6-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 1551-1979 |
| English Name: | Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional) |
| Chinese Name: | 硅外延层电阻率测试方法(电容-电压法)(暂行) |
| Chinese Classification: | H81 Semimetal |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | Fourth Machinery Industry Ministry |
| Issued on: | 1980-03-01 |
| Implemented on: | 1980-6-1 |
| Status: | abolished |
| Abolished on: | 2010-02-01 |
| Target Language: | English |
| File Format: | |
| Word Count: | 5000 words |
| Translation Price(USD): | 184.0 |
| Delivery: | via email in 1~3 business day |