SJ 21347-2018 English Version, SJ 21347-2018 Cryogenic screening test method for cryogenic device and assembly (English Version)

Chinese Classification Professional Classification ICS Classification Latest News Value-added Services

SJ 21347-2018 Cryogenic screening test method for cryogenic device and assembly (English Version)
Standard No.:	SJ 21347-2018	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	7000 words	Translation Price(USD):	210.0 remind me the price change Email:
Implemented on:		Delivery:	via email in 1~3 business day

→

Standard No.:	SJ 21347-2018
English Name:	Cryogenic screening test method for cryogenic device and assembly
Chinese Name:	低温器件与组件极低温度筛选试验方法
Professional Classification:	SJ Professional Standard - Electronics
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	7000 words
Translation Price(USD):	210.0
Delivery:	via email in 1~3 business day

Standard

SJ 21347-2018 Cryogenic screening test method for cryogenic device and assembly (English Version)
Standard No.	SJ 21347-2018
Status	valid
Language	English
File Format	PDF
Word Count	7000 words
Price(USD)	210.0
Implemented on
Delivery	via email in 1~3 business day

Detail of SJ 21347-2018

Standard No.

English Name

Chinese Name

Chinese Classification

Professional Classification

ICS Classification

Issued by

Issued on

Implemented on

Status

Superseded by

Superseded on

Abolished on

Superseding

Language

File Format

Word Count

Price(USD)

Keywords

Introduction of SJ 21347-2018

Contents of SJ 21347-2018

Tel: +86-10-8572 5655 \| Fax: +86-10-8581 9515 \| Email: coc@codeofchina.com \| QQ: 672269886
Copyright: Beijing COC Tech Co., Ltd. 2008-2040



Keywords:
SJ 21347-2018, SJ/T 21347-2018, SJT 21347-2018, SJ21347-2018, SJ 21347, SJ21347, SJ/T21347-2018, SJ/T 21347, SJ/T21347, SJT21347-2018, SJT 21347, SJT21347