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Position: Chinese Standard in English/SJ/T 10566-1994
SJ/T 10566-1994   Testability bus -Part 1:Standard test access port and boundary scan architecture (English Version)
Standard No.: SJ/T 10566-1994 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 44500 words Translation Price(USD):1335.0 remind me the price change

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Implemented on:1994-12-1 Delivery: via email in 1~5 business day

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,,1994-12-1,14113730535162C1B94AB2F6D268B
Standard No.: SJ/T 10566-1994
English Name: Testability bus -Part 1:Standard test access port and boundary scan architecture
Chinese Name: 可测性总线 第一部分:标准测试存取口与边界扫描结构
Chinese Classification: D01    Technical management
Professional Classification: SJ    Professional Standard - Electronics
Source Content Issued by: Ministry of Electronics Industry
Issued on: 1994-08-08
Implemented on: 1994-12-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 44500 words
Translation Price(USD): 1335.0
Delivery: via email in 1~5 business day
本标准规定了数字集成电路和模拟/数字混合集成电路的数字部分用的测试存取口(TAP)与边界扫描结构。本标准规定的测试逻辑可包含在集成电路内,由一个边界扫描寄存器和若干其它块构成,并可通过测试存取口进行存龋本标准适用于在集成电路组装在一块印制电路板或其它基底上后测试集成电路间的互连性、测试集成电路本身和在这个器件正常工作期间观测或修改电路的动作。
Code of China
Standard
SJ/T 10566-1994  Testability bus -Part 1:Standard test access port and boundary scan architecture (English Version)
Standard No.SJ/T 10566-1994
Statusvalid
LanguageEnglish
File FormatPDF
Word Count44500 words
Price(USD)1335.0
Implemented on1994-12-1
Deliveryvia email in 1~5 business day
Detail of SJ/T 10566-1994
Standard No.
SJ/T 10566-1994
English Name
Testability bus -Part 1:Standard test access port and boundary scan architecture
Chinese Name
可测性总线 第一部分:标准测试存取口与边界扫描结构
Chinese Classification
D01
Professional Classification
SJ
ICS Classification
Issued by
Ministry of Electronics Industry
Issued on
1994-08-08
Implemented on
1994-12-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
44500 words
Price(USD)
1335.0
Keywords
SJ/T 10566-1994, SJ 10566-1994, SJT 10566-1994, SJ/T10566-1994, SJ/T 10566, SJ/T10566, SJ10566-1994, SJ 10566, SJ10566, SJT10566-1994, SJT 10566, SJT10566
Introduction of SJ/T 10566-1994
本标准规定了数字集成电路和模拟/数字混合集成电路的数字部分用的测试存取口(TAP)与边界扫描结构。本标准规定的测试逻辑可包含在集成电路内,由一个边界扫描寄存器和若干其它块构成,并可通过测试存取口进行存龋本标准适用于在集成电路组装在一块印制电路板或其它基底上后测试集成电路间的互连性、测试集成电路本身和在这个器件正常工作期间观测或修改电路的动作。
Contents of SJ/T 10566-1994
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Keywords:
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