SJ/T 11222-2000 English Version, SJ/T 11222-2000 General specification for Integrated circuit cards. Part 3: Test methods (English Version)

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SJ/T 11222-2000 General specification for Integrated circuit cards. Part 3: Test methods (English Version)
Standard No.:	SJ/T 11222-2000	Status:	abolished remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	20000 words	Translation Price(USD):	1390.0 remind me the price change Email:
Implemented on:	2000-10-1	Delivery:	via email in 1~5 business day

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Standard No.:	SJ/T 11222-2000
English Name:	General specification for Integrated circuit cards. Part 3: Test methods
Chinese Name:	集成电路卡通用规范第3部分：测试方法
Chinese Classification:	L64 Data medium
Professional Classification:	SJ Professional Standard - Electronics
ICS Classification:	35.240.15 35.240.15 Identification cards and related devices 35.240.15
Issued on:	2000-05-30
Implemented on:	2000-10-1
Status:	abolished
Abolished on:	2011-08-15
Target Language:	English
File Format:	PDF
Word Count:	20000 words
Translation Price(USD):	1390.0
Delivery:	via email in 1~5 business day

Standard

SJ/T 11222-2000 General specification for Integrated circuit cards. Part 3: Test methods (English Version)
Standard No.	SJ/T 11222-2000
Status	abolished
Language	English
File Format	PDF
Word Count	20000 words
Price(USD)	1390.0
Implemented on	2000-10-1
Delivery	via email in 1~5 business day

Detail of SJ/T 11222-2000

Standard No.

English Name

Chinese Name

Chinese Classification

Professional Classification

ICS Classification

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Issued on

Implemented on

Status

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Superseded on

Abolished on

Superseding

Language

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Keywords

Introduction of SJ/T 11222-2000

本规范规定了与ISO/IEC 7810给出的定义相适应的识别卡特性用的测试方法。每一测试方法交叉引用一个或多个基础标准，该基本标准可以是ISO/IEC 7810 或一个或多个定义了用于识别卡应用的信息存储技术的补充标准。本规范定义了为一种或多种卡技术通用的测试方法。

Contents of SJ/T 11222-2000

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