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Position: Chinese Standard in English/SJ/T 11630-2016
SJ/T 11630-2016   Test method for geometric dimension of silicon wafers for solar cell (English Version)
Standard No.: SJ/T 11630-2016 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 5000 words Translation Price(USD):164.0 remind me the price change

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Implemented on:2016-9-1 Delivery: via email in 1~3 business day

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,,2016-9-1,E20CAC6AE52BAC241465198305228
Standard No.: SJ/T 11630-2016
English Name: Test method for geometric dimension of silicon wafers for solar cell
Chinese Name: 太阳能电池用硅片几何尺寸测试方法
Professional Classification: SJ    Professional Standard - Electronics
Source Content Issued by: Ministry of Industry and Information Technology
Issued on: 2016-04-05
Implemented on: 2016-9-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 5000 words
Translation Price(USD): 164.0
Delivery: via email in 1~3 business day
本标准规定了太阳能电池用硅片几何尺寸的测试方法，几何尺寸参数包括边长、对角线、邻边垂直度、倒角宽度和倒角角度。主要内容包括规范性引用文件、术语和定义、方法原理、干扰因素、仪器设备、试样要求、测试环境、测试程序、精密度和试验报告等。
Code of China
Standard
SJ/T 11630-2016  Test method for geometric dimension of silicon wafers for solar cell (English Version)
Standard No.SJ/T 11630-2016
Statusvalid
LanguageEnglish
File FormatPDF
Word Count5000 words
Price(USD)164.0
Implemented on2016-9-1
Deliveryvia email in 1~3 business day
Detail of SJ/T 11630-2016
Standard No.
SJ/T 11630-2016
English Name
Test method for geometric dimension of silicon wafers for solar cell
Chinese Name
太阳能电池用硅片几何尺寸测试方法
Chinese Classification
Professional Classification
SJ
ICS Classification
Issued by
Ministry of Industry and Information Technology
Issued on
2016-04-05
Implemented on
2016-9-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
5000 words
Price(USD)
164.0
Keywords
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Introduction of SJ/T 11630-2016
本标准规定了太阳能电池用硅片几何尺寸的测试方法，几何尺寸参数包括边长、对角线、邻边垂直度、倒角宽度和倒角角度。主要内容包括规范性引用文件、术语和定义、方法原理、干扰因素、仪器设备、试样要求、测试环境、测试程序、精密度和试验报告等。
Contents of SJ/T 11630-2016
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