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| SJ/T 11845.1-2022 (English Version) |
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Detail of SJ/T 11845.1-2022
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Introduction of SJ/T 11845.1-2022
本文件规定了基于低频噪声参数的电子元器件可靠性评价方法的通用要求，为具体电子元器件可靠性的低频噪声评价方法标准的制定和实施提供指导。
本文件适用于在电子元器件生产过程中及使用前对元器件可靠性进行评价，由研制生产企业、用户或其它相应检测机构实施。
Contents of SJ/T 11845.1-2022