T/CIE 070-2020 English Version, T/CIE 070-2020 Evaluation of industrial high-reliability integrated circuits—Part 4:Nonvolatile memory (English Version)

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T/CIE 070-2020 Evaluation of industrial high-reliability integrated circuits—Part 4:Nonvolatile memory (English Version)
Standard No.:	T/CIE 070-2020	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	14500 words	Translation Price(USD):	435.0 remind me the price change Email:
Implemented on:		Delivery:	via email in 1~5 business day

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Standard No.:	T/CIE 070-2020
English Name:	Evaluation of industrial high-reliability integrated circuits—Part 4:Nonvolatile memory
Chinese Name:	工业级高可靠集成电路评价第4部分：非易失性存储器
Chinese Classification:	L56 Semiconductor integrated circuit
Professional Classification:	T/ Social Organization Standard
Source Content Issued by:	CIE
Issued on:	2020-06-08
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	14500 words
Translation Price(USD):	435.0
Delivery:	via email in 1~5 business day

Standard

T/CIE 070-2020 Evaluation of industrial high-reliability integrated circuits—Part 4:Nonvolatile memory (English Version)
Standard No.	T/CIE 070-2020
Status	valid
Language	English
File Format	PDF
Word Count	14500 words
Price(USD)	435.0
Implemented on
Delivery	via email in 1~5 business day

Detail of T/CIE 070-2020

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Introduction of T/CIE 070-2020

本部分规定了工业级高可靠非易失性存储器中的快闪存储器芯片的检测要求、检测方法和检验规则，暂不涉及ROM。
本部分适用于工业级高可靠快闪存储器芯片以及内嵌非易失性存储器芯片的鉴定验收和评价检测活动。

Contents of T/CIE 070-2020

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