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| Position: Chinese Standard in English/YS/T 1755-2025 |
| YS/T 1755-2025 Determination of Total Metal Content and Impurities in Polycrystalline Silicon - Inductively Coupled Plasma Mass Spectrometry (English Version) | |||
| Standard No.: | YS/T 1755-2025 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | Translation Price(USD): | remind me the price change | |
| Implemented on: | 2025-11-1 | Delivery: | |
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| Standard No.: | YS/T 1755-2025 |
| English Name: | Determination of Total Metal Content and Impurities in Polycrystalline Silicon - Inductively Coupled Plasma Mass Spectrometry |
| Chinese Name: | 颗粒硅总金属杂质含量的测定 电感耦合等离子体质谱法 |
| Professional Classification: | YS Professional Standard - Non-ferrous Metal |
| Source Content Issued by: | Ministry of Industry and Information Technology |
| Issued on: | 2025-04-10 |
| Implemented on: | 2025-11-1 |
| Status: | valid |
| Target Language: | English |
| File Format: |