GB/T 4937.4-2012 English version, GB/T 4937.4-2012 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (English)

GB/T 4937.4-2012 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (English)
Standard No.	GB/T 4937.4-2012	Status	Latest
Language	English	File Format	PDF
Price	120 USD	Delivery Time	within 1~3 business day

Superseding
Chinese Name	�뵼�� е��鷽�� 4��֣�ǿ��̬ʪ��飨HAST��
English Name
Chinese Standard Classification
Professional Classification
ICS Classification
Issued on	2012-11-5
Implemented on	2013-2-15
Abolished on
Issued by	AQSIQ,SAC
Chinese Pages
Word Count	4000 words

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