2025-12-14 216.73.216.3
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Code of China
Chinese National Standard List: Technical Management

SJ/T 11124-1997 Encapsulation materials of expoy series powder for use in electronic components 
  Issued on: 1997-9-3   Translation Price(USD): 120.0
SJ/T 11126-1997 Encapsulation materials of phenolic series for use in electronic components 
  Issued on: 1997-9-3   Translation Price(USD): 100.0
SJ/T 11125-1997 Encapsulation materials of epoxy series for use in electronic components 
  Issued on: 1997-9-3   Translation Price(USD): 100.0
SJ/T 11136-1997 Zirconium dioxide used for electronic ceramics 
  Issued on: 1997-9-3   Translation Price(USD): 150.0
SJ/T 10864-1996 Measurement of electrical properties of disk-seal tubes-General 
  Issued on: 1996-11-20   Translation Price(USD): 60.0
SJ/T 10754-1996 Test method for gold, silver and their alloy brazing for electronic devices - Test method for cleanness 
  Issued on: 1996-11-20   Translation Price(USD): 30.0
SJ/T 10921-1996 Potassium silicate solution for use in electronic industry - Methods for determination of potassium carbonate 
  Issued on: 1996-11-20   Translation Price(USD): 185.0
SJ/T 11036-1996 Test method for average linear thermal expansion coefficent of electronic glass 
  Issued on: 1996-11-20   Translation Price(USD): 60.0
SJ/T 11030-1996 Methods of analysis for gold-copper and gold-nickel brazing for electronic devices-Determination of lead (spectrophotometric dithizone method) 
  Issued on: 1996-11-20   Translation Price(USD): 184.0
SJ/T 11015-1996 Methods of analysis for pure silver brazing for electronic devices - Determination of iron (spectrophotometric-O-phenanthroline method) 
  Issued on: 1996-11-20   Translation Price(USD): 184.0
SJ/T 11042-1996 Test method for temperature (Tk-100) of electronic glass with volume resistivity of 100MΩ.cm 
  Issued on: 1996-11-20   Translation Price(USD): 150.0
SJ/T 10819-1996 Detailed specifications for electronic components - 35SX5B black and white picture tubes (Applicable for certification) 
  Issued on: 1996-11-20   Translation Price(USD): 610.0
SJ/T 11025-1996 Analytical methods for silver copper brazing for electron device Determination of lead by atomic absorption spectrophotometry 
  Issued on: 1996-11-20   Translation Price(USD): 100.0
SJ/T 11041-1996 Test method for impact resistance of electronic glass 
  Issued on: 1996-11-20   Translation Price(USD): 15.0
SJ/T 10867-1996 Measurements of electrical properties of disk-seal tubes-Methods of measurement resonator unloaded Q 
  Issued on: 1996-11-20   Translation Price(USD): 70.0
SJ/T 11084-1996 Detailed specifications for electronic components - FU-100F electronic tubes (Applicable for certification) 
  Issued on: 1996-11-20   Translation Price(USD): 530.0
SJ/T 10926-1996 Potassium silicate solution for use in electronic industry - Methods of determination of iron 
  Issued on: 1996-11-20   Translation Price(USD): 70.0
SJ/T 10793-1996 Terms for glass used in electronic applications 
  Issued on: 1996-11-20   Translation Price(USD): 270.0
SJ/T 11026-1996 Methods of analysis for silver-copper brazing for electronic devices - Determination of iron, cadmium and zinc (spectrophotometric-atomic absorption method) 
  Issued on: 1996-11-20   Translation Price(USD): 104.0
SJ/T 11089-1996 Letter symbols for discrete semiconductor components 
  Issued on: 1996-11-20   Translation Price(USD): 1584.0
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