2025-12-14 216.73.216.3
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Chinese National Standard List: Semiconductor discrete devices in general

SJ 50033/154-2002 Semiconductor discrete devices Detail specification for type 3DG251 silicon UHF low-noise transistor 
  Issued on: 2002-10-30   Translation Price(USD): 120.0
GB/T 11499-2001 Letter symbols for discrete semiconductor devices 
  Issued on: 1989-03-03   Translation Price(USD): 570.0
GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices 
  Issued on: 1999-08-02   Translation Price(USD): 240.0
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General 
  Issued on: 1998-01-01   Translation Price(USD): 670.0
GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices 
  Issued on: 1995-01-02   Translation Price(USD): 480.0
GB/T 15651-1995 Semiconductor devices Discrete devices and integrated circuits Part 5: Optoelectronic devices 
  Issued on: 1995-07-24   Translation Price(USD): 970.0
GB 12560-1990 Semiconductor devices--Sectional specification for discrete devices 
  Issued on: 1990-12-06   Translation Price(USD): 165.0
GB 12300-1990 Test methods of safe operating area for power transistors 
  Issued on: 1990-03-15   Translation Price(USD): 75.0
GB/T 249-1989 The rule of type designation for discrete semiconductor 
  Issued on: 1989-03-18   Translation Price(USD): 184.0
GB 11499-1989 Letter symbols for discrete semiconductor devices 
  Issued on:   Translation Price(USD): 1624.0
GB/T 4589.1-1989 Semiconductor devices Generic specification for discrete devices and integrated circuits 
  Issued on: 1989-03-31   Translation Price(USD): 810.0
ZB N 05005-1988  
  Issued on:   Translation Price(USD):
GB 6801-1986 Reference methods of measurement for semiconductor devices 
  Issued on:   Translation Price(USD): 180.0
GB 4938-1985 Acceptance and reliability for discrete semiconductor devices 
  Issued on: 1985-02-06   Translation Price(USD): 105.0
GB 4937-1985 Mechanical and climatic test methods for discrete semiconductor devices 
  Issued on:   Translation Price(USD): 280.0
T/CIE 145-2022 Measurement method of radiation induced traps by deep level transient spectroscopy 
  Issued on: 2022-12-31   Translation Price(USD): 225.0
T/CIE 116-2021 Fault tree analysis method and procedure of electronic components 
  Issued on: 2021-11-22   Translation Price(USD): 375.0
T/CIE 119-2021 Test method and procedure of atmospheric-neutron induced single event effects in semiconductor devices 
  Issued on: 2021-11-22   Translation Price(USD): 225.0
T/CIE 147-2022 Technical specification for evaluation of space TWT accelerated life test 
  Issued on:   Translation Price(USD): 225.0
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