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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Semiconductor devices - Mechanical and climatic test methods - Part 1 : General |
| Chinese Title: | 半导体器件 机械和气候试验 第1部分:总则 |
| Standard No.: | GB/T 4937.1-2006 |
| Category No.: | L40 |
| Issued by: | SAC AQSIQ |
| Issued on: | 2006-8-23 |
| Implemented on: | 2007-2-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | GB/T 4937-1995 Mechanical and climatic test methods for semiconductor devices |
| Word Count: | 2500 words |
| Similar Standards: |
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