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| Chinese National Standard Category: Reliability and maintainability |
| English Title: | Reliability enhancement test of semiconductor devices |
| Chinese Title: | 半导体器件可靠性强化试验方法 |
| Standard No.: | T/CIE 144-2022 |
| Category No.: | L05 |
| Issued by: | CIE |
| Issued on: | 2022-12-31 |
| Implemented on: | |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 8500 words |
| Similar Standards: | GB/T 43038-2023 GB/T 43037-2023 GB/T 43039-2023 GB/T 39844-2021 GB/T 37981-2019 GB/T 37963-2019 GB/T 37407-2019 GB/T 36657-2018 GB/T 36615-2018 GB/T 36467-2018 GB/T 37079-2018 GB/T 37084-2018 GB/T 9414.9-2017 GB/T 15174-2017 GB/T 34987-2017 GB/T 34986-2017 GB/T 35320-2017 GB/T 9414.1-2012 WH/T 56-2013 GB/T 5080.2-2012 |
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