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| Chinese National Standard Category: Program language |
| English Title: | Test method and procedure for identification of physical characteristics of fake and counterfeit microelectronics devices |
| Chinese Title: | 微电子器件假冒翻新物理特征识别方法与程序 |
| Standard No.: | T/CIE 152-2022 |
| Category No.: | L74 |
| Issued by: | CIE |
| Issued on: | 2022-12-31 |
| Implemented on: | |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 8500 words |
| Similar Standards: |
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