2025-12-14 216.73.216.3
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors 130.0 via email in 1~3 business day valid,,2007-2-1
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification 90.0 via email in 1~3 business day valid,,2007-2-1
GB/T 20516-2006 Semiconductor devices - Discrete devices - Part 4: Microwave devices 90.0 via email in 1~3 business day valid,,2007-2-1
GB/T 4589.1-2006 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits 420.0 via email in 1~3 business day valid,,2007-2-1
SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits 400.0 via email in 1~3 business day valid,,2006-12-30
SJ 20938-2005 Microwave circuits - Measuring methods for frequency converters 330.0 via email in 1~3 business day valid,,2006-6-1
GB/T 11499-2001 Letter symbols for discrete semiconductor devices 570.0 via email in 1~5 business day valid,,2002-6-1
JB/T 10096-2000 Selection guidance of case for power semiconductor device 100.0 via email in 1~3 business day valid,,2000-10-1
JB/T 10097-2000 Case for power semiconductor device 270.0 via email in 1~3 business day valid,,2000-10-1
JB/T 9684-2000 Selecting guide of heat sink for power semiconductor device 240.0 via email in 1~3 business day valid,,2000-10-1
GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices 240.0 via email in 1~3 business day valid,,2000-3-1
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General 670.0 via email in 1~3 business day valid,,1999-6-1
QJ 2661-1994 Screening Technical Conditions for Silicon-Bridge Rectifier 135.0 via email in 1~3 business day valid,,1994-10-1
SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810 370.0 via email in 1~3 business day valid,,1991-12-1
T/CIE 145-2022 Measurement method of radiation induced traps by deep level transient spectroscopy 225.0 via email in 1~3 business day valid,,
T/CIE 119-2021 Test method and procedure of atmospheric-neutron induced single event effects in semiconductor devices 225.0 via email in 1~3 business day valid,,
T/CIE 147-2022 Technical specification for evaluation of space TWT accelerated life test 225.0 via email in 1~3 business day valid,,
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GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors 
  Issued on: 2006-08-23   Price(USD): 130.0
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification 
  Issued on: 2006-08-23   Price(USD): 90.0
GB/T 20516-2006 Semiconductor devices - Discrete devices - Part 4: Microwave devices  
  Issued on: 2006-10-10   Price(USD): 90.0
GB/T 4589.1-2006 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits 
  Issued on: 2006-10-10   Price(USD): 420.0
SJ 20961-2006 General principles of measuring methods of A/D and D/A converters for integrated circuits 
  Issued on: 2006-8-7   Price(USD): 400.0
SJ 20938-2005 Microwave circuits - Measuring methods for frequency converters 
  Issued on: 2006-1-18   Price(USD): 330.0
GB/T 11499-2001 Letter symbols for discrete semiconductor devices 
  Issued on: 1989-03-03   Price(USD): 570.0
JB/T 10096-2000 Selection guidance of case for power semiconductor device 
  Issued on: 2000-4-24   Price(USD): 100.0
JB/T 10097-2000 Case for power semiconductor device 
  Issued on: 2000-04-24   Price(USD): 270.0
JB/T 9684-2000 Selecting guide of heat sink for power semiconductor device 
  Issued on: 2000-4-24   Price(USD): 240.0
GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices 
  Issued on: 1999-08-02   Price(USD): 240.0
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General 
  Issued on: 1998-01-01   Price(USD): 670.0
QJ 2661-1994 Screening Technical Conditions for Silicon-Bridge Rectifier 
  Issued on: 1994-04-25   Price(USD): 135.0
SJ/T 10229-1991 Graphic instrument for characteristics of semiconductor tubes for Type XJ4810 
  Issued on: 1991-5-28   Price(USD): 370.0
T/CIE 145-2022 Measurement method of radiation induced traps by deep level transient spectroscopy 
  Issued on: 2022-12-31   Price(USD): 225.0
T/CIE 119-2021 Test method and procedure of atmospheric-neutron induced single event effects in semiconductor devices 
  Issued on: 2021-11-22   Price(USD): 225.0
T/CIE 147-2022 Technical specification for evaluation of space TWT accelerated life test 
  Issued on:   Price(USD): 225.0
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