| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB/T 29505-2013 |
Test method for measuring surface roughness on planar surfaces of silicon wafer |
$430.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 29506-2013 |
300 mm polished monocrystalline silicon wafers |
$160.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 29507-2013 |
Test method for measuring flatness, thickness and total thickness vsriation on silicon wafers. Automated non-contact scanning |
$260.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 29508-2013 |
300 mm monocrystalline silicon as cut slices and grinded slices |
$140.00 |
via email in 1~3 business day |
valid,,2014-2-1 |
|
| GB/T 29849-2013 |
Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry |
$160.00 |
via email in 1~3 business day |
valid,,2014-4-15 |
|
| GB/T 29850-2013 |
Test method for measuring compensation degree of silicon materials used for photovoltaic applications |
$120.00 |
via email in 1~3 business day |
valid,,2014-4-15 |
|
| GB/T 29851-2013 |
Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry |
$120.00 |
via email in 1~3 business day |
valid,,2014-4-15 |
|
| GB/T 29852-2013 |
Test Method for Measuring Phosphorus, Arsenic and Antimony in Silicon Materials Used for Photovoltaic Applications by Secondary Ion Mass Spectrometry |
$110.00 |
via email in 1~3 business day |
valid,,2014-4-15 |
|
| GB/T 30453-2013 |
Metallographs Collection for Original Defects of Crystalline Silicon |
$1200.00 |
via email in 1~3 business day |
valid,,2014-10-1 |
|
| GB/T 30656-2014 |
Polished monocrystalline silicon carbide wafers |
$220.00 |
via email in 1~3 business day |
superseded,2023-10-1,2015-9-1 |
|
| GB/T 30656-2023 |
Polished monocrystalline silicon carbide wafers |
$255.00 |
via email in 1~3 business day |
valid,,2023-10-1 |
|
| GB/T 30854-2014 |
Gallium nitride based epitaxial layer for LED lighting |
$370.00 |
via email in 1~5 business day |
valid,,2015-4-1 |
|
| GB/T 30855-2014 |
GaP substrates for LED epitaxial chips |
$220.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
| GB/T 30856-2014 |
GaAs substrates for LED epitaxial chips |
$220.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
| GB/T 30861-2014 |
Germanium substrate for solar cell |
$130.00 |
via email in 1~3 business day |
valid,,2015-4-1 |
|
| GB/T 30867-2014 |
Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers |
$90.00 |
via email in 1~3 business day |
valid,,2015-2-1 |
|
| GB/T 30868-2014 |
Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching |
$90.00 |
via email in 1~3 business day |
valid,,2015-2-1 |
|
| GB/T 31092-2014 |
Monocrystalline sapphire ingot |
$330.00 |
via email in 1~5 business day |
abolished2023-07-01,2023-7-1,2015-9-1 |
|
| GB/T 31092-2022 |
Monocrystalline sapphire bar |
$135.00 |
via email in 1~3 business day |
valid,,2023-7-1 |
|
| GB/T 31474-2015 |
Soldering fluxes for high-quality interconnections in electronics assembly |
$310.00 |
via email in 1~5 business day |
valid,,2016-1-1 |
|
* Related standard quantity: * Page quantity: *
Current: * First
Previous
[1][2][3][4][5][6][7][8][9]
Next
End
* Related standard quantity: * Page quantity: *
Current: * First
Previous
[1][2][3][4][5][6][7][8][9]
Next
End
|
