Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
JB/T 9491-1999 |
Measuring mathod of major parameter for He-Ne lasers |
$120.00 |
via email in 1~3 business day |
valid,,2000-1-1 |
|
JB/T 9492-1999 |
Series of parameters for Nd: YAG lasers |
$270.00 |
via email in 1~3 business day |
abolished2017-05-12 ,,2001-1-1 |
|
QJ 2082A-1996 |
General Specification for Lasers |
$225.00 |
via email in 1~3 business day |
valid,,1996-12-30 |
|
QJ 2462-1993 |
|
$285.00 |
via email in 1~3 business day |
valid,,1991-6-10 |
|
QJ 2637-1994 |
General Specification for Laser Fuze |
$285.00 |
via email in 1~3 business day |
valid,,1994-10-25 |
|
QJ 3013-1998 |
Technical Requirements for Bonding and Sealing Process of Infrared Optical Products |
$150.00 |
via email in 1~3 business day |
valid,,1998-8-6 |
|
SB/T 10570-2010 |
Application norms of laser marking on half carcass |
$210.00 |
via email in 1~3 business day |
superseded,2019-1-1,2011-6-1 |
|
SJ 20868-2003 |
Measuring methods for charge coupled imaging device |
$340.00 |
via email in 1~3 business day |
valid,,2004-3-1 |
|
SJ 20869-2003 |
Measuring methods for LiNbO3 integrated optical guided-wave modulators |
$220.00 |
via email in 1~3 business day |
valid,,2004-3-1 |
|
SJ 20955-2006 |
Indicators fault locating general specification for |
$210.00 |
via email in 1~3 business day |
valid,,2006-12-30 |
|
SJ 20986-2008 |
general specification for bulk acoustoptic device |
$160.00 |
via email in 1~3 business day |
valid,,2008-6-30 |
|
SJ 2354.1-1983 |
General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.10-1983 |
Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.11-1983 |
Method of measurement for width of blind zone of PIN and avalanche photodiode matrix |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.12-1983 |
Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.13-1983 |
Method of measurement for multiplication factor of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.14-1983 |
Method of measurement for excess noise factor of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.2-1983 |
Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.3-1983 |
Method of measurement for dark current of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
SJ 2354.4-1983 |
Method of measurement for forward voltage drop of PIN and avalanche photodiodes |
$184.00 |
via email in 1~3 business day |
superseded,2015-10-1,1984-7-1 |
|
* Related standard quantity: * Page quantity: *
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* Related standard quantity: * Page quantity: *
Current: * First
Previous
[4][5][6][7][8][9][10][11]
Next
End
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