Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
JB/T 9491-1999 Measuring mathod of major parameter for He-Ne lasers $120.00 via email in 1~3 business day valid
JB/T 9492-1999 Series of parameters for Nd: YAG lasers $270.00 via email in 1~3 business day abolished
QJ 2082A-1996 General Specification for Lasers $225.00 via email in 1~3 business day valid
QJ 2462-1993 $285.00 via email in 1~3 business day valid
QJ 2637-1994 General Specification for Laser Fuze $285.00 via email in 1~3 business day valid
QJ 3013-1998 Technical Requirements for Bonding and Sealing Process of Infrared Optical Products $150.00 via email in 1~3 business day valid
SB/T 10570-2010 Application norms of laser marking on half carcass $210.00 via email in 1~3 business day superseded
SJ 20868-2003 Measuring methods for charge coupled imaging device $340.00 via email in 1~3 business day valid
SJ 20869-2003 Measuring methods for LiNbO3 integrated optical guided-wave modulators $220.00 via email in 1~3 business day valid
SJ 20955-2006 Indicators fault locating general specification for $210.00 via email in 1~3 business day valid
SJ 20986-2008 general specification for bulk acoustoptic device $160.00 via email in 1~3 business day valid
SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.10-1983 Method of measurement for cross-light factor of PIN and avalanche photodiodes matrix $184.00 via email in 1~3 business day superseded
SJ 2354.11-1983 Method of measurement for width of blind zone of PIN and avalanche photodiode matrix $184.00 via email in 1~3 business day superseded
SJ 2354.12-1983 Method of measurement for temperature factor of reverse breakdown voltage of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.13-1983 Method of measurement for multiplication factor of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.14-1983 Method of measurement for excess noise factor of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.2-1983 Method of measurement for reverse break-down voltage of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.3-1983 Method of measurement for dark current of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
SJ 2354.4-1983 Method of measurement for forward voltage drop of PIN and avalanche photodiodes $184.00 via email in 1~3 business day superseded
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