Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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Standard No. Title Price(USD) Delivery Status Add to Cart
DB52/T 1104-2016 Junction-to-case thermal resistance transient test method of semiconductor devices via email in business day valid
GB/T 11499-2001 Letter symbols for discrete semiconductor devices $570.00 via email in 1~5 business day valid
GB/T 12560-1999 Semiconductor devices --Sectional specification for discrete devices $240.00 via email in 1~3 business day valid
GB/T 17573-1998 Semiconductor devices Discrete devices and integrated circuits Part 1:General $670.00 via email in 1~3 business day valid
GB/T 20516-2006 Semiconductor devices - Discrete devices - Part 4: Microwave devices $90.00 via email in 1~3 business day valid
GB/T 20521-2006 Semconductor devices Part 14-1: Semiconductor sensors - General and classification $90.00 via email in 1~3 business day valid
GB/T 20522-2006 Semiconductor devices Part 14-3: Semiconductor sensors - Pressure sensors $130.00 via email in 1~3 business day valid
GB/T 20870.1-2007 Semiconductor devices-Part 16-1:Microwave integrated circuits-Amplifiers $450.00 via email in 1~3 business day valid
GB/T 20870.2-2023 Semiconductor devices—Part 16-2: Microwave integrated circuits—Frequency prescalers $435.00 via email in 1~5 business day valid
GB/T 20870.4-2024 Semiconductor devices—Part 16-4：Microwave intergrated circuits—Switches $435.00 via email in 1~5 business day valid
GB/T 20870.5-2023 Semiconductor devices—Part 16-5: Microwave integrated circuits—Oscillators $600.00 via email in 1~5 business day valid
GB/T 249-2017 The rule of type designation for discrete semiconductor devices $70.00 via email in 1~3 business day valid
GB/T 29332-2012 Semiconductor devices—Discrete devices—Part 9:Insulated-gate bipolar transistors (IGBT) $750.00 via email in 1~3 business day valid
GB/T 45716-2025 Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs) $270.00 via email in 1~3 business day to be valid
GB/T 45718-2025 Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers $315.00 via email in 1~5 business day to be valid
GB/T 45719-2025 Semiconductor devices—Hot carrier test on metal-oxide semiconductor(MOS) transistors $270.00 via email in 1~3 business day to be valid
GB/T 45720-2025 Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films $375.00 via email in 1~5 business day to be valid
GB/T 45721.1-2025 Semiconductor devices—Stress migration test—Part 1: Copper stress migration test $435.00 via email in 1~5 business day to be valid
GB/T 45722-2025 Semiconductor devices—Constant current electromigration test $270.00 via email in 1~3 business day to be valid
GB/T 4589.1-2006 Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits $420.00 via email in 1~3 business day valid
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