2025-12-5 216.73.216.21
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 43186.1-2023 Surface acoustic wave (SAW) and bulk acoustic wave(BAW) duplexers of assessed quality—Part 1:Generic specification 435.0 via email in 1~5 business day valid,,2024-1-1
GB/T 43186.2-2023 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality—Part 2:Guidelines for the use 315.0 via email in 1~5 business day valid,,2024-1-1
GB/T 43023-2023 Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) 285.0 via email in 1~3 business day valid,,2024-1-1
GB/T 43024.2-2023 Measurement techniques of piezoelectric,dielectric and electrostatic oscillators—Part 2: Phase jitter measurement method 400.0 via email in 1~5 business day valid,,2024-1-1
GB/T 22317.4-2023 Piezoelectric filters of assessed quality—Part 4: Sectional specification—Capability approval 400.0 via email in 1~5 business day valid,,2024-1-1
GB/T 22319.6-2023 Measurement of quartz crystal unit parameters—Part 6: Measurement of drive level dependence(DLD) 305.0 via email in 1~3 business day valid,,2024-1-1
GB/T 22317.401-2023 Piezoelectric filters of assessed quality—Part 4-1: Blank detail specification—Capability approval 160.0 via email in 1~3 business day valid,,2024-1-1
GB/T 22318.1-2023 Surface acoustic wave (SAW) resonators—Part 1:Generic specification 600.0 via email in 1~5 business day valid,,2024-1-1
GB/T 22318.2-2023 Surface acoustic wave (SAW) resonators—Part 2: Guide to the use 400.0 via email in 1~5 business day valid,,2024-1-1
GB/T 8553-2023 Generic specification for enclosures for crystal units 240.0 via email in 1~3 business day valid,,2024-1-1
GB/T 27700.1-2023 Surface acoustic wave(SAW) filters of assessed quality—Part 1:Generic specification 630.0 via email in 1~5 business day valid,,2023-12-1
GB/T 12274.401-2023 Quartz crystal controlled oscillators of assessed quality—Part 4-1: Blank detail specification—Capability approval 255.0 via email in 1~3 business day valid,,2023-12-1
GB/T 12274.4-2021 Quartz crystal controlled oscillators of assessed quality—Part 4: Sectional specification—Capability approval 315.0 via email in 1~5 business day valid,,2022-5-1
GB 12275-1990 The rule of type designation for quarz crystal oscillators 60.0 via email in 1~3 business day valid,,1990-10-1
GB/T 22319.11-2018 Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction 220.0 via email in 1~3 business day valid,,2018-10-1
GB/T 22319.9-2018 Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units 220.0 via email in 1~3 business day valid,,2018-10-1
GB/T 12859.2-2012 Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components (IECQ) - Part 2: Sectional specification-Qualification approval 270.0 via email in 1~3 business day valid,,2013-2-15
GB/T 22319.8-2008 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units 85.0 via email in 1~3 business day valid,,2009-1-1
GB/T 12273.1-2017 Quartz crystal units of assessed quality-Part 1:Generic specification 580.0 via email in 1~3 business day valid,,2017-12-1
JC/T 2148-2012 Langasite piezoelectric crystal 120.0 via email in 1~3 business day valid,,2013-6-1
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GB/T 43186.1-2023 Surface acoustic wave (SAW) and bulk acoustic wave(BAW) duplexers of assessed quality—Part 1:Generic specification 
  Issued on: 2023-9-7   Price(USD): 435.0
GB/T 43186.2-2023 Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality—Part 2:Guidelines for the use 
  Issued on: 2023-9-7   Price(USD): 315.0
GB/T 43023-2023 Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) 
  Issued on: 2023-9-7   Price(USD): 285.0
GB/T 43024.2-2023 Measurement techniques of piezoelectric,dielectric and electrostatic oscillators—Part 2: Phase jitter measurement method 
  Issued on: 2023-9-7   Price(USD): 400.0
GB/T 22317.4-2023 Piezoelectric filters of assessed quality—Part 4: Sectional specification—Capability approval 
  Issued on: 2023-9-7   Price(USD): 400.0
GB/T 22319.6-2023 Measurement of quartz crystal unit parameters—Part 6: Measurement of drive level dependence(DLD) 
  Issued on: 2023-9-7   Price(USD): 305.0
GB/T 22317.401-2023 Piezoelectric filters of assessed quality—Part 4-1: Blank detail specification—Capability approval 
  Issued on: 2023-9-7   Price(USD): 160.0
GB/T 22318.1-2023 Surface acoustic wave (SAW) resonators—Part 1:Generic specification 
  Issued on: 2023-9-7   Price(USD): 600.0
GB/T 22318.2-2023 Surface acoustic wave (SAW) resonators—Part 2: Guide to the use 
  Issued on: 2023-9-7   Price(USD): 400.0
GB/T 8553-2023 Generic specification for enclosures for crystal units 
  Issued on: 2023-9-7   Price(USD): 240.0
GB/T 27700.1-2023 Surface acoustic wave(SAW) filters of assessed quality—Part 1:Generic specification 
  Issued on: 2023-08-06   Price(USD): 630.0
GB/T 12274.401-2023 Quartz crystal controlled oscillators of assessed quality—Part 4-1: Blank detail specification—Capability approval 
  Issued on: 2023-08-06   Price(USD): 255.0
GB/T 12274.4-2021 Quartz crystal controlled oscillators of assessed quality—Part 4: Sectional specification—Capability approval 
  Issued on: 2021-10-11   Price(USD): 315.0
GB 12275-1990 The rule of type designation for quarz crystal oscillators 
  Issued on: 1990-03-15   Price(USD): 60.0
GB/T 22319.11-2018 Measurement of quartz crystal unit parameters—Part 11:Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction 
  Issued on: 2018-03-15   Price(USD): 220.0
GB/T 22319.9-2018 Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units 
  Issued on: 2018-03-15   Price(USD): 220.0
GB/T 12859.2-2012 Piezoelectric ceramic resonators - A specification in the IEC quality assessment System for electronic components (IECQ) - Part 2: Sectional specification-Qualification approval 
  Issued on: 2012-11-5   Price(USD): 270.0
GB/T 22319.8-2008 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units 
  Issued on: 2008-08-06   Price(USD): 85.0
GB/T 12273.1-2017 Quartz crystal units of assessed quality-Part 1:Generic specification 
  Issued on: 2017-05-31   Price(USD): 580.0
JC/T 2148-2012 Langasite piezoelectric crystal 
  Issued on: 2012-12-28   Price(USD): 120.0
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