2025-12-5 216.73.216.21
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 46223-2025 Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis 570.0 via email in 1~5 business day to be valid,,2026-3-1
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) 315.0 via email in 1~5 business day to be valid,,2026-3-1
T/COEMA 22O-2025 Photothermal-Lensing absorption measuring instrument (PLI) via email in business day valid,,2025-3-5
GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal 480.0 via email in 1~5 business day valid,,2024-11-1
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips 225.0 via email in 1~3 business day valid,,2024-10-1
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy 375.0 via email in 1~5 business day valid,,2024-7-1
GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials 700.0 via email in 1~5 business day valid,,2024-4-1
GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy 255.0 via email in 1~3 business day valid,,2023-7-1
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis 210.0 via email in 1~3 business day valid,,2023-2-1
GB/T 34831-2017 Nanotechnologies-Electron microscopy imaging of noble metal nanoparticles- High angle annular dark field imaging method 220.0 via email in 1~2 business day valid,,2018-5-1
GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy 540.0 via email in 1~3 business day valid,,2014-11-1
JB/T 11144-2011 X-ray diffractometer 120.0 via email in 1~3 business day valid,,2012-4-1
JB/T 11145-2011 X-ray fluorescence spectrometer 120.0 via email in 1~3 business day valid,,2012-4-1
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis 210.0 via email in 1~3 business day valid,,2011-12-1
JB/T 9400-2010 Specification of X-ray diffractometer 130.0 via email in 1~3 business day valid,,2010-7-1
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary 450.0 via email in 1~5 business day valid,,2009-12-1
GB/T 18151-2008 Laser guards 780.0 via email in 1~5 business day superseded,2017-3-1,2009-10-1
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 220.0 via email in 1~3 business day valid,,2009-4-1
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors 120.0 via email in 1~3 business day superseded,2016-9-1,2007-8-1
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM 180.0 via email in 1~3 business day valid,,2007-2-1
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GB/T 46223-2025 Microbeam analysis—Analytical electron microscopy—Method for the determination of energy resolution for electron energy loss spectrum analysis 
  Issued on: 2025-8-29   Price(USD): 570.0
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) 
  Issued on: 2025-8-29   Price(USD): 315.0
T/COEMA 22O-2025 Photothermal-Lensing absorption measuring instrument (PLI) 
  Issued on: 2025-02-25   Price(USD):
GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal 
  Issued on: 2024-4-25   Price(USD): 480.0
GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips 
  Issued on: 2024-3-15   Price(USD): 225.0
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy 
  Issued on: 2023-12-28   Price(USD): 375.0
GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials  
  Issued on: 2023-09-07   Price(USD): 700.0
GB/T 42208-2022 Nanotechnologies—Measurement of nanoparticle size in multiphase system—Image method of transmission electron microsopy 
  Issued on: 2022-12-30   Price(USD): 255.0
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis 
  Issued on: 2022-10-12   Price(USD): 210.0
GB/T 34831-2017 Nanotechnologies-Electron microscopy imaging of noble metal nanoparticles- High angle annular dark field imaging method 
  Issued on: 2017-11-01   Price(USD): 220.0
GB/T 30543-2014 Nanotechnologies - Characterization of Single-Wall Carbon Nanotubes Using Transmission Electron Microscopy 
  Issued on: 2014-5-6   Price(USD): 540.0
JB/T 11144-2011 X-ray diffractometer 
  Issued on: 2011-12-20   Price(USD): 120.0
JB/T 11145-2011 X-ray fluorescence spectrometer 
  Issued on: 2011-12-20   Price(USD): 120.0
GB/T 26533-2011 General rules for Auger electron spectroscopic analysis 
  Issued on: 2011-5-12   Price(USD): 210.0
JB/T 9400-2010 Specification of X-ray diffractometer 
  Issued on: 2010-2-11   Price(USD): 130.0
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary 
  Issued on: 2009-04-01   Price(USD): 450.0
GB/T 18151-2008 Laser guards 
  Issued on: 2000-07-24   Price(USD): 780.0
GB/T 15247-2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using calibration curve method 
  Issued on: 2008-08-20   Price(USD): 220.0
GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors 
  Issued on: 2006-12-25   Price(USD): 120.0
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM 
  Issued on: 2006-07-19   Price(USD): 180.0
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