GB/T 14141-1993 English Version, GB/T 14141-1993 Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array (English Version)

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GB/T 14141-1993 Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array (English Version)
Standard No.:	GB/T 14141-1993	Status:	remind me the status change Email:
Language:	English	File Format:	PDF
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Standard No.:	GB/T 14141-1993
English Name:	Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array
Professional Classification:	GB National Standard
Language:	English
File Format:	PDF
Price(USD):	220.0

Standard

GB/T 14141-1993 Test method for sheet resistance of silicon epitaxial, diffused and ion-implanted layers using a collinear four-probe array (English Version)
Standard No.	GB/T 14141-1993
Status
Language	English
File Format	PDF
Word Count	words
Price(USD)	220.0
Implemented on
Delivery	via email in business day

Detail of GB/T 14141-1993

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Introduction of GB/T 14141-1993

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