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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | |
| Chinese Title: | GaN HEMT 射频器件陷阱效应测试方法 |
| Standard No.: | DB13/T 5695-2023 |
| Category No.: | L40 |
| Issued by: | Hebei Provincial Administration for Market Regulation |
| Issued on: | 2023-05-06 |
| Implemented on: | 2023-6-6 |
| Status: | abolished |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | 2025-10-08 |
| Superseding: | 公告：河北省市场监管局关于721项河北省地方标准的公告 2025年第27号 |
| Word Count: | words |
| Similar Standards: |
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