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| Chinese National Standard Category: Semiconductor discrete devices in general |
| English Title: | Semiconductor devices—Constant current electromigration test |
| Chinese Title: | 半导体器件 恒流电迁移试验 |
| Standard No.: | GB/T 45722-2025 |
| Category No.: | L40 |
| Issued by: | SAMR; SAC |
| Issued on: | 2025-05-30 |
| Implemented on: | 2025-9-1 |
| Status: | valid |
| Superseded by: | |
| Superseded on: | |
| Abolished on: | |
| Superseding: | |
| Word Count: | 9000 words |
| Similar Standards: | GB/T 46567.1-2025 GB/T 4937.16-2025 GB/T 45722-2025 GB/T 45721.1-2025 GB/T 45718-2025 GB/T 45719-2025 GB/T 45716-2025 DB32/T 4894-2024 GB 4938-1985 GB/T 4937.35-2024 GB/T 4937.34-2024 ZB N 05005-1988 T/CIE 145-2022 GB/T 4587-2023 DB13/T 5696-2023 DB13/T 5695-2023 GB/T 42709.19-2023 GB/T 4937.26-2023 T/CIE 116-2021 T/CIE 119-2021 |
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